The DOI matches its Crossref record.
Determination of Optical Constants from Reflectance or Transmittance Measurements on Bulk Crystals or Thin Films
Abstract
The optical constants of bulk materials and thin films have been conveniently determined employing an automatic curve-fitting procedure to obtain a classical oscillator fit to reflectance and/or transmittance data. The method compares favorably in convenience and accuracy with a Kramers–Kronig analysis of bulk reflectivity spectra and is a better technique than the R,T or T,T methods presently used to analyze spectro-photometric data of thin films.
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Citations
Cited by
Refractive index of silicon and germanium and its wavelength and temperature derivatives
Li, H. H. (1980) · Journal of Physical and Chemical Reference Data · doi:10.1063/1.555624 · Cited by 863
Study of zone-folding effects on phonons in alternating monolayers of GaAs-AlAs
Barker, A. S., Merz, J. L., & Gossard, A. C. (1978) · Physical Review B · doi:10.1103/physrevb.17.3181 · Cited by 279
Metadata
- Authors
- Verleur, H. W.
- Venue
- Journal of the Optical Society of America
- Publisher
- Optica Publishing Group
- Published
- 1968-10-01
- Volume
- 58
- Issue
- 10
- Pages
- 1356
- ISSN
- 0030-3941 (ISSN-L)
- OpenAlex
- W2031327585
- Cited by
- 199
- References
- 0
- FWCI
- 3.71
- Type
- journal article
- Language
- en
- Open access
- closed
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- Verleur, H. W. (1968). Determination of Optical Constants from Reflectance or Transmittance Measurements on Bulk Crystals or Thin Films. Journal of the Optical Society of America. https://doi.org/10.1364/josa.58.001356
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Bibliographic data: Semantic Scholar, OpenAlex, Crossref.
Contains information from the Semantic Scholar Academic Graph Datasets, made available under the ODC Attribution License (ODC-BY 1.0).
Semantic Scholar’s data is described in: Kinney, R., et al. (2023). The Semantic Scholar Open Data Platform. arXiv:2301.10140.
