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Mueller matrix ellipsometry with imperfect compensators
Abstract
We describe the use of an ellipsometer having the configuration PCSC’A to determine the Mueller matrix of a linear optical system S, using imperfect compensators C and C′ and linear polarizer P and analyzer A. Two manual (16 intensity), one semiautomatic (rotating-compensator) and one fully automatic (dual rotating-compensator) methods are described. Real-time Fourier analysis (of both raw and reduced data) is used in the automatic methods to reduce random and systematic measurement errors. Calibration procedures given for each method permit Mueller matrix spectroscopy using (quasi-) achromatic retarders whose principal axes, as well as retardation and transmission ratios change slightly with wavelength.
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Citations
Cited by
Mueller matrix dual-rotating retarder polarimeter
Goldstein, D. H. (1992) · Applied Optics · doi:10.1364/ao.31.006676 · Cited by 375
Gil, J. J. (2007) · The European Physical Journal Applied Physics · doi:10.1051/epjap:2007153 · Cited by 272
Broadband division-of-amplitude polarimeter based on uncoated prisms
Compain, E., & Drevillon, B. (1998) · Applied Optics · doi:10.1364/ao.37.005938 · Cited by 105
Metadata
- Authors
- Hauge, P. S.
- Venue
- Journal of the Optical Society of America
- Publisher
- Optica Publishing Group
- Published
- 1978-11-01
- Volume
- 68
- Issue
- 11
- Pages
- 1519
- ISSN
- 0030-3941 (ISSN-L)
- OpenAlex
- W1982771627
- Cited by
- 171
- References
- 0
- FWCI
- 2.69
- Type
- journal article
- Language
- en
- Open access
- closed
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- Hauge, P. S. (1978). Mueller matrix ellipsometry with imperfect compensators. Journal of the Optical Society of America. https://doi.org/10.1364/josa.68.001519
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