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Cited by 375

The DOI matches its Crossref record; 3 of the 3 references it cites were found in a registry or an index.

Mueller matrix dual-rotating retarder polarimeter

Goldstein, Dennis H.·1992·Applied Optics
DOI 10.1364/ao.31.006676
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Abstract

A computer-controlled Mueller matrix polarimeter with dual rotating retarders is described. Bulk properties of optical materials are determined by controlling the input-polarization state and measuring the output-polarization state. The Mueller matrix of a sample is obtained from polarimetric measurements, and polarization properties, i.e., diattenuation and retardance as well as depolarization, are extracted from the Mueller matrix. Further, fundamental electro- and magneto-optical material properties such as the electro-optical tensor coefficients may be obtained from Mueller matrices measured with applied fields. The polarimeter is currently configured to operate over the 3- to 12-microm spectral region.

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Metadata

Authors
Goldstein, D. H.
Venue
Applied Optics
Publisher
Optica Publishing Group
Published
1992-11-01
Volume
31
Issue
31
Pages
6676
ISSN
  • 0003-6935 (ISSN-L)
  • 1539-4522
DOI
10.1364/ao.31.006676
OpenAlex
W2081586326
Cited by
375
References
3
FWCI
0.83
Type
journal article
Language
en
Open access
closed

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CoChat. (2026). Citation check: Mueller matrix dual-rotating retarder polarimeter. https://app.cochat.ai/papers/10.1364/ao.31.006676
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Goldstein, D. H. (1992). Mueller matrix dual-rotating retarder polarimeter. Applied Optics. https://doi.org/10.1364/ao.31.006676

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Contains information from the Semantic Scholar Academic Graph Datasets, made available under the ODC Attribution License (ODC-BY 1.0).

Semantic Scholar’s data is described in: Kinney, R., et al. (2023). The Semantic Scholar Open Data Platform. arXiv:2301.10140.