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High-resolution ab initio three-dimensional x-ray diffraction microscopy
Open accessAbstract
Coherent x-ray diffraction microscopy is a method of imaging nonperiodic isolated objects at resolutions limited, in principle, by only the wavelength and largest scattering angles recorded. We demonstrate x-ray diffraction imaging with high resolution in all three dimensions, as determined by a quantitative analysis of the reconstructed volume images. These images are retrieved from the three-dimensional diffraction data using no a priori knowledge about the shape or composition of the object, which has never before been demonstrated on a nonperiodic object. We also construct two-dimensional images of thick objects with greatly increased depth of focus (without loss of transverse spatial resolution). These methods can be used to image biological and materials science samples at high resolution with x-ray undulator radiation and establishes the techniques to be used in atomic-resolution ultrafast imaging at x-ray free-electron laser sources.
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Cites
Potential for biomolecular imaging with femtosecond X-ray pulses
Neutze, R., Wouts, R., van der Spoel, D., Weckert, E., & Hajdu, J. (2000) · Nature · doi:10.1038/35021099 · Cited by 2,022
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Hard-X-Ray Lensless Imaging of Extended Objects
Rodenburg, J. M., Hurst, A. C., Cullis, A. G., Dobson, B. R., Pfeiffer, F., Bunk, O., David, C., Jefimovs, K., & Johnson, I. (2007) · Physical Review Letters · doi:10.1103/physrevlett.98.034801 · Cited by 855
X-ray ptychographic computed tomography at 16 nm isotropic 3D resolution
Holler, M., Diaz, A., Guizar-Sicairos, M., Karvinen, P., Färm, E., Härkönen, E., Ritala, M., Menzel, A., Raabe, J., & Bunk, O. (2014) · Scientific Reports · doi:10.1038/srep03857 · Cited by 357
The 3D-architecture of individual free silver nanoparticles captured by X-ray scattering
Barke, I., Hartmann, H., Rupp, D., Flückiger, L., Sauppe, M., Adolph, M., Schorb, S., Bostedt, C., Treusch, R., Peltz, C., et al. (2015) · Nature Communications · doi:10.1038/ncomms7187 · Cited by 100
Yoon, C. H., Yurkov, M. V., Schneidmiller, E. A., Samoylova, L., Buzmakov, A., Jurek, Z., Ziaja, B., Santra, R., Loh, N. D., Tschentscher, T., et al. (2016) · Scientific Reports · doi:10.1038/srep24791 · Cited by 51
Metadata
- Authors
- Chapman, H. N., Barty, A., Marchesini, S., Noy, A., Hau-Riege, S. P., Cui, C., Howells, M. R., Rosen, R., He, H., Spence, J. C. H., Weierstall, U., Beetz, T., Jacobsen, C., & Shapiro, D.
- Venue
- Journal of the Optical Society of America A
- Publisher
- Optica Publishing Group
- Published
- 2006-05-01
- Volume
- 23
- Issue
- 5
- Pages
- 1179
- ISSN
- 1084-7529 (ISSN-L)
- 1520-8532
- OpenAlex
- W2126276266
- Cited by
- 592
- References
- 1
- FWCI
- 29.28
- Type
- journal article
- Language
- en
- Open access
- green
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- Chapman, H. N., Barty, A., Marchesini, S., Noy, A., Hau-Riege, S. P., Cui, C., Howells, M. R., Rosen, R., He, H., Spence, J. C. H., Weierstall, U., Beetz, T., Jacobsen, C., & Shapiro, D. (2006). High-resolution ab initio three-dimensional x-ray diffraction microscopy. Journal of the Optical Society of America A. https://doi.org/10.1364/josaa.23.001179
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