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Thin-film sensing with planar terahertz metamaterials: sensitivity and limitations
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The limiting effects of varying the thickness of a dielectric overlayer on planar double split-ring resonator (SRR) arrays are studied by terahertz time-domain spectroscopy. Uniform dielectric overlayers from 100 nm to 16 mum thick are deposited onto fixed SRR arrays in order to shift the resonance frequency of the electric response. We discuss the bounds of resonance shifting and emphasize the resulting limitations for SRR-based sensing. These results are presented in the context of typical biosensing situations and are compared to previous work and other existing sensing platforms.
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“Various techniques have been reported to improve the detection threshold for THz thin film sensing, e. g., evaluation of difference signals, 3 resonance changes of metamaterials, 4 or the application of metal meshes to enhance the amplitude reduction of the THz bandpass.5”
From Highly sensitive terahertz measurement of layer thickness using a two-cylinder waveguide sensor (2010) · cites this paper as [4]
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Metadata
- Authors
- O'Hara, J. F., Singh, R., Brener, I., Smirnova, E., Han, J., Taylor, A. J., & Zhang, W.
- Affiliations
- Oklahoma State University (US)
- Sandia National Laboratories (US)
- Los Alamos National Laboratory (US)
- Venue
- Optics Express
- Publisher
- Optica Publishing Group
- Published
- 2008
- Volume
- 16
- Issue
- 3
- Pages
- 1786
- ISSN
- 1094-4087 (ISSN-L)
- OpenAlex
- W2026644949
- Cited by
- 521
- References
- 25
- Citations by year
- 2026: 18 · 2025: 13 · 2024: 19 · 2023: 26 · 2022: 31 · 2021: 26 · 2020: 26 · 2019: 43 · 2018: 31 · 2017: 35 · 2016: 34 · 2015: 28 · 2014: 33 · 2013: 31 · 2012: 52
- FWCI
- 9.56
- Type
- journal article
- Language
- en
- Open access
- gold
- doi.org
- Licence
- Locations
- Optics Express (publishedVersion)
- PubMed (publishedVersion)
- Funders
- National Science Foundation
- U.S. Department of Energy
- National Nuclear Security Administration
- Basic Energy Sciences
- Office of Experimental Program to Stimulate Competitive Research
- Sandia National Laboratories
- Los Alamos National Laboratory
- Topics
- Physical Sciences › Materials Science › Electronic, Optical and Magnetic Materials › Metamaterials and Metasurfaces Applications
- Physical Sciences › Engineering › Electrical and Electronic Engineering › Terahertz technology and applications
- Physical Sciences › Engineering › Electrical and Electronic Engineering › Microwave and Dielectric Measurement Techniques
- Keywords
- terahertz metamaterials, split ring resonator, resonant frequency shift, biosensing, sensitivity limits, terahertz time-domain spectroscopy
- MeSH terms
- Computer Simulation, Materials Testing, Membranes, Artificial, Models, Theoretical, Refractometry, Sensitivity and Specificity, Reproducibility of Results, Biosensing Techniques
About these checks
Registry, retraction, Cites and statistics results are computed, not judged, with one exception: a printed reference that no index lists is read once by a model before it counts as a citation error. Claims are extracted by a model and kept only when their quote appears verbatim in the text; each cited source is then checked, with a model’s help, for whether it says what the claim relies on. Those verdicts can be wrong — read the claim’s quote and the cited source before relying on one.
Statistics and arithmetic are recomputed, not judged.
Confidence bands are shown only for fields calibrated on our annotated test set. None is calibrated yet, so no band is shown.
What counts as a claim ›How we measure confidence ›How we check this ›
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