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Optimization of low-temperature spectral emissivity measurement scheme based on background factor evaluation

Yuan, Zeye, Li, Longfei, Cui, Minghuan, Wang, Qingchang, Yu, Kun, Liu, Yufang·2025·Optics Express
DOI 10.1364/oe.548006
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Abstract

Accurate spectral emissivity is essential for assessing the radiation efficiency of the thermal emitter and confirming its intended function. However, precise emissivity measurements at low temperatures are challenging due to weak spontaneous radiation and interference from background radiation. This study presents a low-temperature spectral emissivity measurement scheme that combines the radiation modulation technology and the background factor optimization algorithm. The influence of potential background factors on the target radiation measurement is systematically evaluated by combining theoretical simulation and experimental validation. The reliability of the measurement scheme is demonstrated by measuring the spectral emissivity of silicon carbide within the temperature range of 213-273 K, achieving an expanded uncertainty of less than 0.01. Our scheme aims to provide a guideline for performing accurate spectral emissivity measurements at low temperatures.

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  • At a fixed wavelength, emissivity of silicon carbide at 213 K was observed to increase as the viewing angle θ decreased, consistent with reduced reflectivity near normal incidence.

    “At a fixed wavelength, emissivity was observed to increase as the viewing angle θ decreased, consistent with reduced reflectivity near normal incidence.”

    From Thermal Radiation Testing Methods at Cryogenic Temperatures: A Review (2026) · cites this paper as [26]

  • Yuan et al. measured the spectrally resolved directional emissivity of silicon carbide at 213 K and found pronounced wavelength-dependent behavior.

    “Yuan et al. [26] measured the spectrally resolved directional emissivity of silicon carbide at T = 213 K, revealing pronounced wavelengthdependent behavior.”

    From Thermal Radiation Testing Methods at Cryogenic Temperatures: A Review (2026) · cites this paper as [26]

  • The management of background noise has advanced from simple subtraction to complex modeling and active adjustment, thereby enhancing the accuracy of testing systems.

    “Furthermore, the management of background noise has advanced from simple subtraction [44] to complex modeling and active adjustment [26,55], thereby enhancing the accuracy of testing systems.”

    From Thermal Radiation Testing Methods at Cryogenic Temperatures: A Review (2026) · cites this paper as [26]

  • In Yuan et al.'s emissivity study, the accuracy of spectral emissivity measurements under low-temperature conditions was improved by means of a systematic evaluation and effective mitigation of the impact of background factors.

    “For instance, in Yuan et al.'s emissivity study [26], which was based on the measurement of direct radiation techniques, the accuracy of spectral emissivity measurements under low-temperature conditions was improved by means of a systematic evaluation and effective mitigation of the impact of background factors.”

    From Thermal Radiation Testing Methods at Cryogenic Temperatures: A Review (2026) · cites this paper as [26]

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Metadata

Authors
Yuan, Z., Li, L., Cui, M., Wang, Q., Yu, K., & Liu, Y.
Affiliations
Institute of Physics, Henan Academy of Sciences
ORCID
Liu, Yufang
Venue
Optics Express
Publisher
Optica Publishing Group
Published
2025-01-29
Volume
33
Issue
3
Pages
4647
ISSN
1094-4087
DOI
10.1364/oe.548006
Cited by
2
References
0
Language
en
Licence
Funders
  • National Natural Science Foundation of China (U23A20377, 62075058, 62305107)
  • Open Project of Technology Innovation Center of Infrared Remote Sensing Metrology Technology, State Administration for Market Regulation (AKYKF2307)
  • Provincial Joint Fund for Science and Technology Research and Development Program (235200810059)
  • Innovation Scientists and Technicians Troop Construction Projects of Henan Province (22400051007)
  • Henan Province University Innovation Talents Support Program (23IRTSTHN013)

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