The DOI matches its Crossref record.
Broadband antireflection gratings fabricated upon silicon substrates
Abstract
We fabricated a two-dimensional subwavelength structured (SWS) surface upon a crystal silicon substrate. The SWS surface was patterned by electron beam lithography and etched by an SF(6) fast atom beam. The SWS grating had a conical profile, the period was 150 nm, and the groove was approximately 350 nm deep. The reflectivity was examined at 2002500-nm wavelengths. At 400 nm the reflectivity decreased to 0.5% from the 54.7% of the silicon substrate. We also used HeNe laser light to examine the reflectivity as a function of the incident angle.
Overview
The claims and statistics of this paper haven’t been checked yet.
Run the check — free, no account needed. It reads the open-access text and checks the sources it cites.
Integrity signals
Registry
Cites
Statistics
Verification
Claims the paper makes
The claims and statistics of this paper haven’t been checked yet.
Run the check — free, no account needed. It reads the open-access text and checks the sources it cites.
Self-check
Percentages, sums and reported differences re-computed from the paper’s own numbers.
The self-check needs the paper’s full text.
Citations
Cited by
Waveguide sub‐wavelength structures: a review of principles and applications
Halir, R., Bock, P. J., Cheben, P., Ortega‐Moñux, A., Alonso‐Ramos, C., Schmid, J. H., Lapointe, J., Xu, D., Wangüemert‐Pérez, J. G., Molina‐Fernández, Í., et al. (2015) · Laser & Photonics Reviews · doi:10.1002/lpor.201400083 · Cited by 658
Anti-reflecting and photonic nanostructures
Chattopadhyay, S., Huang, Y. F., Jen, Y. J., Ganguly, A., Chen, K. H., & Chen, L. C. (2010) · Materials Science and Engineering: R: Reports · doi:10.1016/j.mser.2010.04.001 · Cited by 632
Horie, Y., Han, S., Lee, J.-Y., Kim, J., Kim, Y., Arbabi, A., Shin, C., Shi, L., Arbabi, E., Kamali, S. M., et al. (2017) · Nano Letters · doi:10.1021/acs.nanolett.7b00636 · Cited by 135
Metadata
- Authors
- Kanamori, Y., Sasaki, M., & Hane, K.
- Venue
- Optics Letters
- Publisher
- Optica Publishing Group
- Published
- 1999-10-15
- Volume
- 24
- Issue
- 20
- Pages
- 1422
- ISSN
- 0146-9592 (ISSN-L)
- 1539-4794
- OpenAlex
- W2019290169
- Cited by
- 439
- References
- 0
- FWCI
- 4.18
- Type
- journal article
- Language
- en
- Open access
- closed
About these checks
Registry, retraction, Cites and statistics results are computed, not judged, with one exception: a printed reference that no index lists is read once by a model before it counts as a citation error. Claims are extracted by a model and kept only when their quote appears verbatim in the text; each cited source is then checked, with a model’s help, for whether it says what the claim relies on. Those verdicts can be wrong — read the claim’s quote and the cited source before relying on one.
Statistics and arithmetic are recomputed, not judged.
Confidence bands are shown only for fields calibrated on our annotated test set. None is calibrated yet, so no band is shown.
What counts as a claim ›How we measure confidence ›How we check this ›
Are you an author, or do you see a problem with this page? Request a review
How to cite
Cite CoChat for the checks on this page, and the paper for its own findings.
- This page
- CoChat. (2026). Citation check: Broadband antireflection gratings fabricated upon silicon substrates. https://app.cochat.ai/papers/10.1364/ol.24.001422
- The paper
- Kanamori, Y., Sasaki, M., & Hane, K. (1999). Broadband antireflection gratings fabricated upon silicon substrates. Optics Letters. https://doi.org/10.1364/ol.24.001422
Data sources
Bibliographic data: Semantic Scholar, OpenAlex, Crossref.
Contains information from the Semantic Scholar Academic Graph Datasets, made available under the ODC Attribution License (ODC-BY 1.0).
Semantic Scholar’s data is described in: Kinney, R., et al. (2023). The Semantic Scholar Open Data Platform. arXiv:2301.10140.