Cited by 60X-ray Diffraction in CrystallographyAdvanced X-ray Imaging TechniquesNuclear Physics and Applications

Synchrotron scattering methods for nanomaterials and soft matter research

Open access
Narayanan, Theyencheri, Konovalov, Oleg·2020·Materials

Abstract

This article aims to provide an overview of broad range of applications of synchrotron scattering methods in the investigation of nanoscale materials. These scattering techniques allow the elucidation of the structure and dynamics of nanomaterials from sub-nm to micron size scales and down to sub-millisecond time ranges both in bulk and at interfaces. A major advantage of scattering methods is that they provide the ensemble averaged information under in situ and operando conditions. As a result, they are complementary to various imaging techniques which reveal more local information. Scattering methods are particularly suitable for probing buried structures that are difficult to image. Although, many qualitative features can be directly extracted from scattering data, derivation of detailed structural and dynamical information requires quantitative modeling. The fourth-generation synchrotron sources open new possibilities for investigating these complex systems by exploiting the enhanced brightness and coherence properties of X-rays.

The claims and statistics of this paper haven’t been checked yet.

Run the check — free, no account needed. It reads the open-access text and checks the sources it cites.

A few free checks a day · papers already verified open instantly · results are public

Integrity signals

Registry

Crossref · 10.3390/ma13030752

Cites

251 of 251 references verified0 citation errors · 0 not checkable

Statistics

Claims the paper makes

The claims and statistics of this paper haven’t been checked yet.

Run the check — free, no account needed. It reads the open-access text and checks the sources it cites.

A few free checks a day · papers already verified open instantly · results are public

Self-check

Percentages, sums and reported differences re-computed from the paper’s own numbers.

The self-check needs the paper’s full text.

Cites

Flagged first, then by citations

Cited by

Sorted by citations

Authors
Narayanan, T., & Konovalov, O.
Affiliations
European Synchrotron Radiation Facility (FR)
Corresponding author
Narayanan, Theyencheri
Venue
Materials
Publisher
MDPI AG
Published
2020-02-06
Volume
13
Issue
3
Pages
752
ISSN
1996-1944 (ISSN-L)
OpenAlex
W3005408993
Cited by
60
References
251
Citations by year
2026: 6 · 2025: 8 · 2024: 7 · 2023: 10 · 2022: 10 · 2021: 11 · 2020: 7 · 2019: 1
FWCI
0.49
Type
journal article
Language
en
Open access
Locations
  • Materials (publishedVersion, cc-by)
  • PubMed Central (publishedVersion, cc-by)
  • PubMed (publishedVersion)
  • HAL (submittedVersion, other-oa)
  • DOAJ (DOAJ: Directory of Open Access Journals) (submittedVersion)
Topics
  • Physical Sciences › Materials Science › Materials Chemistry › X-ray Diffraction in Crystallography
  • Physical Sciences › Physics and Astronomy › Radiation › Advanced X-ray Imaging Techniques
  • Physical Sciences › Physics and Astronomy › Radiation › Nuclear Physics and Applications
Keywords
nanomaterials, soft matter, X-ray scattering, nanostructures, nanoscale dynamics, interfaces, buried structures

About these checks

Registry, retraction, Cites and statistics results are computed, not judged, with one exception: a printed reference that no index lists is read once by a model before it counts as a citation error. Claims are extracted by a model and kept only when their quote appears verbatim in the text; each cited source is then checked, with a model’s help, for whether it says what the claim relies on. Those verdicts can be wrong — read the claim’s quote and the cited source before relying on one.

Statistics and arithmetic are recomputed, not judged.

Confidence bands are shown only for fields calibrated on our annotated test set. None is calibrated yet, so no band is shown.

What counts as a claim ›How we measure confidence ›How we check this ›

Are you an author, or do you see a problem with this page? Request a review