Cited by 6Electronic and Structural Properties of OxidesAdvancements in Solid Oxide Fuel CellsMagnetic and transport properties of perovskites and related materials

Surface stability of epitaxial LaNiO3-δthin films

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Mickevičius, Sigitas, Grebinskij, S., Bondarenka, V., Tvardauskas, H., Senulis, M., Lisauskas, V., Šliužienė, K., Vengalis, B. +2 more·2010·Lithuanian Journal of Physics

Abstract

Thin LaNiO 3- films with pseudocubic (100) preferred orientation were prepared by reactive DC magnetron sputtering and in situ annealed in O2 and vacuum. X-ray photoelectron spectroscopy (XPS) was used to determine the variation in composition of the films under high temperature annealing. The experimental O 1s and La 3d -Ni 2p 3/2 spectra of LaNiO 3- films was analysed in terms of O 2-, O -/(OH) -, and weakly adsorbed oxygen species. It was shown that the change in the type of conductivity from metallic to semiconducting one is accompanied by a marked increase in the intensity of the lateral (531 eV) peak of oxygen. The quantitative analyses of La 3d -Ni 2p 3/2 spectra show that the Ni/La concentration ratio significantly decreases after heating above the dehydration temperature. These variations in conductivity and surface composition were attributed to the loss of lattice oxygen with subsequent adsorption of O -and (OH) -anions and weakly adsorbed oxygen species from ambient air.

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  • The La/Ni fluctuations are likely formed due to NiO evaporation and interaction of film surface with environment during heat treatment.

    “These fluctuations are likely formed due to NiO evaporation and an interaction of the film surface with the environment during the heat treatment [50,51,52,53,54,55].”

    From Control of Columnar Grain Microstructure in CSD LaNiO3 Films (2023) · cites this paper as [51]

    The Results and discussion (p. 4) report a decreased Ni/La ratio after heating and attribute nickel loss to nickel hydroxide evaporation or decomposition, not NiO evaporation. The Summary and conclusions (p. 6) also describe adsorption of species from ambient air, supporting the environmental-interaction part of the claim. (LLM, conf=0.88)

    Experimental — accuracy not yet measured
  • The film surface changes in composition due to NiO evaporation and interaction with atmosphere.

    “As it was pointed earlier (see Figure 2), the film surface changes in composition due to NiO evaporation and interaction with the atmosphere [50,51,52,53,54,55].”

    From Control of Columnar Grain Microstructure in CSD LaNiO3 Films (2023) · cites this paper as [51]

    The Results and discussion (p. 4) report a decrease in surface Ni/La after heating and suggest nickel hydroxide evaporation or decomposition as the cause. The Summary and conclusions (p. 6) and Results and discussion (p. 4) also describe adsorption from ambient air and surface changes after exposure. The paper does not identify NiO evaporation as the cause, and its proposed mechanism is qualified rather than established. (LLM, conf=0.88)

    Experimental — accuracy not yet measured

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Authors
Mickevičius, S., Grebinskij, S., Bondarenka, V., Tvardauskas, H., Senulis, M., Lisauskas, V., Šliužienė, K., Vengalis, B., Orlowski, B. A., & Baškys, E.
Affiliations
  • Center for Physical Sciences and Technology (LT)
  • Institute of Physics (PL)
Venue
Lithuanian Journal of Physics
Published
2010
Volume
50
Issue
3
Pages
317-323
ISSN
1648-8504 (ISSN-L)
OpenAlex
W2083203308
Cited by
6
References
23
Citations by year
2025: 1 · 2023: 1 · 2020: 1 · 2016: 1 · 2014: 2
FWCI
0.00
Type
journal article
Language
en
Open access
Locations
Lithuanian Journal of Physics (publishedVersion)
Topics
  • Physical Sciences › Materials Science › Materials Chemistry › Electronic and Structural Properties of Oxides
  • Physical Sciences › Materials Science › Materials Chemistry › Advancements in Solid Oxide Fuel Cells
  • Physical Sciences › Materials Science › Electronic, Optical and Magnetic Materials › Magnetic and transport properties of perovskites and related materials
Keywords
epitaxial thin films, surface stability, in situ annealing, oxygen vacancies, lattice oxygen loss, adsorbed oxygen species, semiconductor-metal transition, surface composition, magnetron sputtering, XPS core-level spectra

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