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Beam-induced motion correction for sub-megadalton cryo-EM particles

Open access
Scheres, Sjors HW·2014·eLife

Abstract

In electron cryo-microscopy (cryo-EM), the electron beam that is used for imaging also causes the sample to move. This motion blurs the images and limits the resolution attainable by single-particle analysis. In a previous Research article (Bai et al., 2013) we showed that correcting for this motion by processing movies from fast direct-electron detectors allowed structure determination to near-atomic resolution from 35,000 ribosome particles. In this Research advance article, we show that an improved movie processing algorithm is applicable to a much wider range of specimens. The new algorithm estimates straight movement tracks by considering multiple particles that are close to each other in the field of view, and models the fall-off of high-resolution information content by radiation damage in a dose-dependent manner. Application of the new algorithm to four data sets illustrates its potential for significantly improving cryo-EM structures, even for particles that are smaller than 200 kDa.

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Metadata

Authors
Scheres, S. H.
Venue
eLife
Published
2014-08-13
Volume
3
Pages
e03665-e03665
ISSN
2050-084X (ISSN-L)
OpenAlex
W2146801942
Cited by
335
References
2
FWCI
32.60
Type
journal article
Language
en
Open access
gold

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CoChat. (2026). Citation check: Beam-induced motion correction for sub-megadalton cryo-EM particles. https://app.cochat.ai/papers/10.7554/elife.03665
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Scheres, S. H. (2014). Beam-induced motion correction for sub-megadalton cryo-EM particles. eLife. https://doi.org/10.7554/elife.03665

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