CoChat
Sign Up
Cited by 9Phase-change materials and chalcogenidesLaser Material Processing TechniquesAdvanced Data Storage Technologies

100-Layer recording in fused silica for semi permanent data storage

Open access
Imai, Ryo, Shiozawa, Manabu, Shintani, Toshimichi, Watanabe, Takao, Mori, Shigeki, Shimotsuma, Yasuhiko, Sakakura, Masaaki, Miura, Kiyotaka +1 more·2015·Japanese Journal of Applied Physics
DOI 10.7567/jjap.54.09mc02
Open this paper in CoChat — free accountOpen PDF

Abstract

Data storage using fused silica is a candidate archival medium for long-term preservation of important data such as official documents and cultural heritages. It is highly resistant to high temperature and chemical damage, and the Arrhenius law suggests that it would have a semi permanent lifetime. In order to improve the recording density of this type of storage, we increased the number of recording layers to 100 and achieved a recording density of 1.5 Gbyte/in. 2 without the use of an error correction code. The total bit error rate of all 100 layers was 2.3 × 10 −4 , which is acceptable for practical use. The analysis of the experimental results suggests that a further increase in the number of recording layers is possible by the correction of the spherical aberration induced by a mismatch in the refractive index at the surface of a medium.

The claims and statistics of this paper haven’t been checked yet.

Run the check — free, no account needed. It reads the open-access text and checks the sources it cites.

A few free checks a day · papers already verified open instantly · results are public

Integrity signals

Registry

Crossref · 10.7567/jjap.54.09mc02

Cites

32 of 32 references verified0 citation errors · 0 not checkable

Statistics

Claims the paper makes

The claims and statistics of this paper haven’t been checked yet.

Run the check — free, no account needed. It reads the open-access text and checks the sources it cites.

A few free checks a day · papers already verified open instantly · results are public

Claims other papers make about this one

Each is checked against this paper’s own text: does it say what the citing paper says it does?

  • The resulting weak modifications allow improvement of density substantially beyond reported approaches because they exhibit low scattering and cross-talk and so enable data writing and reading from more than 300 layers.

    “The resulting weak modifications allow us to improve density substantially beyond reported approaches because they exhibit low scattering and cross-talk and so enable data writing and reading from more than 300 layers10,25,27 (see section ‘Reading and decoding data’).”

    From Laser writing in glass for dense, fast and efficient archival data storage (2026) · cites this paper as [27]

    Sections 3.1 and 4 report increased recording density and successful writing and reading in 100 layers. Section 3.2 concludes that interlayer crosstalk need not limit further increases, but the paper does not demonstrate more than 300 layers or attribute that capability to weak, low-scattering modifications. (LLM, conf=0.89)

    Experimental — accuracy not yet measured

Self-check

Percentages, sums and reported differences re-computed from the paper’s own numbers.

The self-check needs the paper’s full text.

Cites

Flagged first, then by citations

Research works printed but not linked: 28

  1. [1]1. E. N. Glezer, M. Milosavljevic, L. Huang, R. J. Finlay, T. H. Her, J. P. Callan, and E. Mazur, Opt. Lett. 21, 2023 (1996).
  2. [2]2. M. Watanabe, H. Sun, S. Juodkazis, T. Takahashi, S. Matsuo, Y. Suzuki, J. Nishii, and H. Misawa, Jpn. J. Appl. Phys. 37, L1527 (1998).
  3. [3]3. J. Qiu, K. Miura, and K. Hirao, Jpn. J. Appl. Phys. 37, 2263 (1998).
  4. [4]4. M. Watanabe, S. Juodkazis, H.-B. Sun, S. Matsuo, H. Misawa, M. Miwa, and R. Kaneko, Appl. Phys. Lett. 74, 3957 (1999).
  5. [5]5. M. Watanabe, S. Juodkazis, S. Matsuo, J. Nishii, and H. Misawa, Jpn. J. Appl. Phys. 39, 6763 (2000).
  6. [6]6. J. Zhang, M. Gecevičius, M. Beresna, and P. G. Kazansky, Phys. Rev. Lett. 112, 033901 (2014).
  7. [7]7. R. R. Gattass and E. Mazur, Nat. Photonics 2, 219 (2008).
  8. [8]8. J. W. Chan, T. Huser, S. Risbud, and D. M. Krol, Opt. Lett. 26, 1726 (2001).
  9. [9]9. E. N. Glezer and E. Mazur, Appl. Phys. Lett. 71, 882 (1997).
  10. [10]10. J. Song, X. Wang, X. Hu, Y. Dai, J. Qiu, Y. Cheng, and Z. Xu, Appl. Phys. Lett. 92, 092904 (2008).
  11. [11]11. S. M. Eaton, H. Zhang, P. R. Herman, F. Yoshino, L. Shah, J. Bovatsek, and A. Y. Arai, Opt. Express 13, 4708 (2005).
  12. [12]12. B. C. Stuart, M. D. Feit, A. M. Rubenchik, B. W. Shore, and M. D. Perry, Phys. Rev. Lett. 74, 2248 (1995).
  13. [13]13. A. Couairon, L. Sudrie, M. Franco, B. Prade, and A. Mysyrowicz, Phys. Rev. B 71, 125435 (2005).
  14. [14]14. Y. Bellouard and M.-O. Hongler, Opt. Express 19, 6807 (2011).
  15. [15]15. B. C. Stuart, M. D. Feit, S. Herman, A. M. Rubenchik, B. W. Shore, and M. D. Perry, Phys. Rev. B 53, 1749 (1996).
  16. [16]16. T. Watanabe, T. Shintani, K. Ono, and T. Mine, IEICE Electron. Express 6, 1569 (2009).
  17. [18]18. M. Shiozawa, T. Watanabe, M. Umeda, R. Imai, T. Mine, Y. Shimotsuma, M. Sakakura, K. Miura, and K. Watanabe, J. Laser Micro/Nanoeng. 9, 1 (2014).
  18. [19]19. Y. Shimotsuma, M. Sakakura, P. G. Kazansky, M. Beresna, J. Qiu, K. Miura, and K. Hirao, Adv. Mater. 22, 4039 (2010).
  19. [20]20. M. Beresna, M. Gecevičius, P. G. Kazansky, T. Taylor, and A. V. Kavokin, Appl. Phys. Lett. 101, 053120 (2012).
  20. [21]21. Y. Shimotsuma, P. G. Kazansky, J. Qiu, and K. Hirao, Phys. Rev. Lett. 91, 247405 (2003).
  21. [22]22. R. S. Taylor, C. Hnatovsky, E. Simova, P. P. Rajeev, D. M. Rayner, and P. B. Corkum, Opt. Lett. 32, 2888 (2007).
  22. [23]23. Y. Shimotsuma, M. Sakakura, and K. Miura, Opt. Mater. Express 1, 803 (2011).
  23. [24]24. C. Hnatovsky, R. S. Taylor, P. P. Rajeev, E. Simova, V. R. Bhardwaj, D. M. Rayner, and P. B. Corkum, Appl. Phys. Lett. 87, 014104 (2005).
  24. [27]27. A. Marcinkevičius, V. Mizeikis, S. Juodkazis, S. Matsuo, and H. Misawa, Appl. Phys. A 76, 257 (2003).
  25. [28]28. C. Hnatovsky, R. S. Taylor, E. Simova, V. R. Bhardwaj, D. M. Rayner, and P. B. Corkum, J. Appl. Phys. 98, 013517 (2005).
  26. [29]29. H. Itoh, N. Matsumoto, and T. Inoue, Opt. Express 17, 14367 (2009).
  27. [30]30. A. Stone, H. Jain, V. Dierolf, M. Sakakura, Y. Shimotsuma, K. Miura, and K. Hirao, J. Opt. Soc. Am. B 30, 1234 (2013).
  28. [31]31. T. Ota, T. Sugiura, S. Kawata, M. J. Booth, M. A. A. Neil, R. Juškaitis, and T. Wilson, Jpn. J. Appl. Phys. 42, L701 (2003).

Cited by

Sorted by citations

Related

Authors
Imai, R., Shiozawa, M., Shintani, T., Watanabe, T., Mori, S., Shimotsuma, Y., Sakakura, M., Miura, K., & Watanabe, K.
Affiliations
  • Hitachi (Japan) (JP)
  • Kyoto University (JP)
Corresponding author
Imai, Ryo
ORCID
Venue
Japanese Journal of Applied Physics
Publisher
IOP Publishing
Published
2015-08-25
Volume
54
Issue
9S
Pages
09MC02
ISSN
  • 0021-4922 (ISSN-L)
  • 1347-4065
DOI
10.7567/jjap.54.09mc02
OpenAlex
W1413872850
Cited by
9
References
32
Citations by year
2026: 2 · 2024: 1 · 2023: 1 · 2022: 1 · 2017: 2 · 2016: 2
FWCI
0.54
Type
journal article
Language
en
Open access
Licence
Locations
Japanese Journal of Applied Physics (publishedVersion)
Topics
  • Physical Sciences › Materials Science › Materials Chemistry › Phase-change materials and chalcogenides
  • Physical Sciences › Engineering › Computational Mechanics › Laser Material Processing Techniques
  • Physical Sciences › Computer Science › Computer Networks and Communications › Advanced Data Storage Technologies
Keywords
fused silica, data archiving, recording density, bit error rate, spherical aberration correction, refractive index mismatch, long-term data preservation

About these checks

Registry, retraction, Cites and statistics results are computed, not judged, with one exception: a printed reference that no index lists is read once by a model before it counts as a citation error. Claims are extracted by a model and kept only when their quote appears verbatim in the text; each cited source is then checked, with a model’s help, for whether it says what the claim relies on. Those verdicts can be wrong — read the claim’s quote and the cited source before relying on one.

Statistics and arithmetic are recomputed, not judged.

Confidence bands are shown only for fields calibrated on our annotated test set. None is calibrated yet, so no band is shown.

What counts as a claim ›How we measure confidence ›How we check this ›

Are you an author, or do you see a problem with this page? Request a review