Bayne, Stephen B.

High-Mobility Stable 1200-V, 150-A 4H-SiC DMOSFET Long-Term Reliability Analysis Under High Current Density Transient Conditions

Schrock, J. A., Ray II, W. B., Lawson, K., Bilbao, A., Bayne, S. B., Holt, S. L., Cheng, L., Palmour, J. W., & Scozzie, C. (2015) · IEEE Transactions on Power Electronics

Silicon Carbide Semiconductor TechnologiesGaN-based semiconductor devices and materials

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Analysis and Mitigation of Power System Harmonics in Industrial Vfd Applications Using Passive Filter Configurations

Munsi, M. S., Alao, A. B., Dasari, B. K., Tadese, Y. B., Dhakal, B., Chamana, M., Adeyanju, O. M., & Bayne, S. (2026) · 2026 IEEE Texas Power and Energy Conference (TPEC)

Power Quality and HarmonicsElectromagnetic Compatibility and Noise Suppression

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