Ghibaudo, G.

Review on high-k dielectrics reliability issues

Ribes, G., Mitard, J., Denais, M., Bruyere, S., Monsieur, F., Parthasarathy, C., Vincent, E., & Ghibaudo, G. (2005) · IEEE Transactions on Device and Materials Reliability

Semiconductor materials and devicesCopper Interconnects and Reliability

Cited by 533

Ultimately thin double-gate SOI MOSFETs

Ernst, T., Cristoloveanu, S., Ghibaudo, G., Ouisse, T., Horiguchi, S., Ono, Y., Takahashi, Y., & Murase, K. (2003) · IEEE Transactions on Electron Devices

Advancements in Semiconductor Devices and Circuit DesignSemiconductor materials and devices

Cited by 245

Ultra-thin fully-depleted SOI MOSFETs: Special charge properties and coupling effects

Eminente, S., Cristoloveanu, S., Clerc, R., Ohata, A., & Ghibaudo, G. (2007) · Solid-State Electronics

Advancements in Semiconductor Devices and Circuit DesignSemiconductor materials and devices

Cited by 139