Wang, Bixuan
Virginia Tech
2 papers on CoChatORCID 0000-0002-2489-944X
Most cited papers
- Verified
Stability, Reliability, and Robustness of GaN Power Devices: A Review
Kozak, J. P., Zhang, R., Porter, M., Song, Q., Liu, J., Wang, B., Wang, R., Saito, W., & Zhang, Y. (2023) · IEEE Transactions on Power Electronics
GaN-based semiconductor devices and materialsSilicon Carbide Semiconductor Technologies
Cited by 441
- Verified
Pulsed Overcurrent Capability of Power Semiconductor Devices in Solid-State Circuit Breakers: SiC MOSFET vs. Si IGBT
Yang, X., Liu, J., Wang, B., & Zhang, G. (2022) · 2022 IEEE Applied Power Electronics Conference and Exposition (APEC)
Silicon Carbide Semiconductor TechnologiesHVDC Systems and Fault Protection
Cited by 18
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