Rech, Paolo

Analyzing and Increasing the Reliability of Convolutional Neural Networks on GPUs

Santos, F. F. D., Pimenta, P. F., Lunardi, C., Draghetti, L., Carro, L., Kaeli, D., & Rech, P. (2019) · IEEE Transactions on Reliability

Radiation Effects in ElectronicsDistributed systems and fault tolerance

Cited by 226

Soft errors in DNN accelerators: A comprehensive review

Ibrahim, Y., Wang, H., Liu, J., Wei, J., Chen, L., Rech, P., Adam, K., & Guo, G. (2020) · Microelectronics Reliability

Radiation Effects in ElectronicsDistributed systems and fault tolerance

Cited by 102

Artificial Neural Networks for Space and Safety-Critical Applications: Reliability Issues and Potential Solutions

Rech, P. (2024) · IEEE Transactions on Nuclear Science

Radiation Effects in ElectronicsSoftware Reliability and Analysis Research

Cited by 75

Cross-Layer Reliability Evaluation and Efficient Hardening of Large Vision Transformers Models

Roquet, L., Fernandes dos Santos, F., Rech, P., Traiola, M., Sentieys, O., & Kritikakou, A. (2024) · Proceedings of the 61st ACM/IEEE Design Automation Conference

Radiation Effects in ElectronicsVLSI and Analog Circuit Testing

Cited by 16

Evaluation of Histogram of Oriented Gradients Soft Errors Criticality for Automotive Applications

Fernandes, F., Weigel, L., Jung, C., Navaux, P., Carro, L., & Rech, P. (2016) · ACM Transactions on Architecture and Code Optimization

Radiation Effects in ElectronicsDistributed systems and fault tolerance

Cited by 14

Vision Transformer Reliability Evaluation on the Coral Edge TPU

Loureiro Coelho, B., Rafael Bodmann, P., Cavagnero, N., Frost, C., & Rech, P. (2025) · IEEE Transactions on Nuclear Science

Radiation Effects in ElectronicsAdvanced Neural Network Applications

Cited by 5

Evaluating the Reliability of Vision Transformers for Space Robotics Applications

Bodmann, P. R., Rech, P., & Saveriano, M. (2024) · 2024 International Conference on Space Robotics (iSpaRo)

Radiation Effects in ElectronicsAdversarial Robustness in Machine Learning

Cited by 5

Increasing the Efficiency and Efficacy of Selective-Hardening for Parallel Applications

Oliveira, D., Navaux, P., & Rech, P. (2019) · 2019 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)

Distributed systems and fault toleranceRadiation Effects in Electronics

Cited by 5

Neutron-Induced Error Rate of Vision Transformer Models on GPUs

Dos Santos, F. F., Rech, P., Kritikakou, A., & Sentieys, O. (2023) · 2023 23rd European Conference on Radiation and Its Effects on Components and Systems (RADECS)

Radiation Effects in ElectronicsAdversarial Robustness in Machine Learning

Cited by 4