Sun, Xiaoyu
Taiwan Semiconductor Manufacturing Company (United States)
5 papers on CoChatORCID 0000-0001-5337-5680
Most cited papers
- Verified
A 65nm 4Kb algorithm-dependent computing-in-memory SRAM unit-macro with 2.3ns and 55.8TOPS/W fully parallel product-sum operation for binary DNN edge processors
Khwa, W.-S., Chen, J.-J., Li, J.-F., Si, X., Yang, E.-Y., Sun, X., Liu, R., Chen, P.-Y., Li, Q., Yu, S., et al. (2018) · 2018 IEEE International Solid - State Circuits Conference - (ISSCC)
Advanced Memory and Neural ComputingLow-power high-performance VLSI design
Cited by 260
- Verified
XNOR-RRAM: A scalable and parallel resistive synaptic architecture for binary neural networks
Sun, X., Yin, S., Peng, X., Liu, R., Seo, J.-S., & Yu, S. (2018) · 2018 Design, Automation & Test in Europe Conference & Exhibition (DATE)
Advanced Memory and Neural ComputingLow-power high-performance VLSI design
Cited by 246
- Verified
High-Throughput In-Memory Computing for Binary Deep Neural Networks With Monolithically Integrated RRAM and 90-nm CMOS
Yin, S., Sun, X., Yu, S., & Seo, J.-S. (2020) · IEEE Transactions on Electron Devices
Advanced Memory and Neural ComputingLow-power high-performance VLSI design
Cited by 171
- Verified
Impact of Non-Ideal Characteristics of Resistive Synaptic Devices on Implementing Convolutional Neural Networks
Sun, X., & Yu, S. (2019) · IEEE Journal on Emerging and Selected Topics in Circuits and Systems
Advanced Memory and Neural ComputingFerroelectric and Negative Capacitance Devices
Cited by 170
- Verified
A 40-nm MLC-RRAM Compute-in-Memory Macro With Sparsity Control, On-Chip Write-Verify, and Temperature-Independent ADC References
Li, W., Sun, X., Huang, S., Jiang, H., & Yu, S. (2022) · IEEE Journal of Solid-State Circuits
Advanced Memory and Neural ComputingAdvanced Neural Network Applications
Cited by 77
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