Bahman, Amir Sajjad
Aalborg University
2 papers on CoChatORCID 0000-0001-7138-1902
Most cited papers
- Verified
Complete Loss and Thermal Model of Power Semiconductors Including Device Rating Information
Ma, K., Bahman, A. S., Beczkowski, S., & Blaabjerg, F. (2015) · IEEE Transactions on Power Electronics
Silicon Carbide Semiconductor TechnologiesAdvanced DC-DC Converters
Cited by 199
- Verified
Impact of device aging in the compact electro-thermal modeling of SiC power MOSFETs
Ceccarelli, L., Bahman, A. S., & Iannuzzo, F. (2019) · Microelectronics Reliability
Silicon Carbide Semiconductor TechnologiesGaN-based semiconductor devices and materials
Cited by 26
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