Vankayalapati, Bhanu Teja

Temperature-Independent Gate-Oxide Degradation Monitoring of SiC MOSFETs Based on Junction Capacitances

Farhadi, M., Yang, F., Pu, S., Vankayalapati, B. T., & Akin, B. (2021) · IEEE Transactions on Power Electronics

Silicon Carbide Semiconductor TechnologiesSemiconductor materials and devices

Cited by 93

A Practical On-Board SiC MOSFET Condition Monitoring Technique for Aging Detection

Pu, S., Yang, F., Vankayalapati, B. T., Ugur, E., Xu, C., & Akin, B. (2020) · IEEE Transactions on Industry Applications

Silicon Carbide Semiconductor TechnologiesRadiation Effects in Electronics

Cited by 75

AC Power Cycling Test Setup and Condition Monitoring Tools for SiC-Based Traction Inverters

Farhadi, M., Vankayalapati, B. T., Sajadi, R., & Akin, B. (2023) · IEEE Transactions on Vehicular Technology

Silicon Carbide Semiconductor TechnologiesMultilevel Inverters and Converters

Cited by 24

Two stage integrated on-board charger for EVs

Vankayalapati, B. T., Singh, R., & Bussa, V. K. (2018) · 2018 IEEE International Conference on Industrial Technology (ICIT)

Advanced DC-DC ConvertersElectric and Hybrid Vehicle Technologies

Cited by 18