Ran, Li

Chongqing University · University of Warwick

2 papers on CoChatORCID 0000-0002-9626-6799

Most cited papers

Verified
Condition Monitoring for Device Reliability in Power Electronic Converters: A Review
Yang, S., Xiang, D., Bryant, A., Mawby, P., Ran, L., & Tavner, P. (2010) · IEEE Transactions on Power Electronics
Silicon Carbide Semiconductor TechnologiesReliability and Maintenance Optimization
Cited by 1,278
Verified
Long-Term Reliability Evaluation of Power Modules With Low Amplitude Thermomechanical Stresses and Initial Defects
Hu, B., Konaklieva, S., Kourra, N., Williams, M. A., Ran, L., & Lai, W. (2021) · IEEE Journal of Emerging and Selected Topics in Power Electronics
Electronic Packaging and Soldering TechnologiesSilicon Carbide Semiconductor Technologies
Cited by 46

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