The DOI matches its Crossref record; 22 of the 22 references it cites were found in a registry or an index.
Enhanced Charge Carrier Mobility in Two‐Dimensional High Dielectric Molybdenum Oxide
Abstract
We demonstrate that the energy bandgap of layered, high-dielectric α-MoO(3) can be reduced to values viable for the fabrication of 2D electronic devices. This is achieved through embedding Coulomb charges within the high dielectric media, advantageously limiting charge scattering. As a result, devices with α-MoO(3) of ∼11 nm thickness and carrier mobilities larger than 1100 cm(2) V(-1) s(-1) are obtained.
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Cites
Electric Field Effect in Atomically Thin Carbon Films
Novoselov, K. S., Geim, A. K., Morozov, S. V., Jiang, D., Zhang, Y., Dubonos, S. V., Grigorieva, I. V., & Firsov, A. A. (2004) · Science · doi:10.1126/science.1102896 · Cited by 66,834
Radisavljevic, B., Radenovic, A., Brivio, J., Giacometti, V., & Kis, A. (2011) · Nature Nanotechnology · doi:10.1038/nnano.2010.279 · Cited by 14,939
Physics of Semiconductor Devices
Sze, S. M., & Ng, K. K. (2006) · doi:10.1002/0470068329 · Cited by 14,627
Physics of Semiconductor Devices
(2002) · Kluwer Academic Publishers eBooks · doi:10.1007/b117561 · Cited by 13,963
Two-dimensional atomic crystals
Novoselov, K. S., Jiang, D., Schedin, F., Booth, T. J., Khotkevich, V. V., Morozov, S. V., & Geim, A. K. (2005) · Proceedings of the National Academy of Sciences · doi:10.1073/pnas.0502848102 · Cited by 11,788
Electronic properties of two-dimensional systems
Ando, T., Fowler, A. B., & Stern, F. (1982) · Reviews of Modern Physics · doi:10.1103/revmodphys.54.437 · Cited by 7,455
Semiconductor Material and Device Characterization
Schroder, D. K. (2005) · Wiley eBooks · doi:10.1002/0471749095 · Cited by 7,435
Chemically Derived, Ultrasmooth Graphene Nanoribbon Semiconductors
Li, X., Wang, X., Zhang, L., Lee, S., & Dai, H. (2008) · Science · doi:10.1126/science.1150878 · Cited by 4,790
Narrow graphene nanoribbons from carbon nanotubes
Jiao, L., Zhang, L., Wang, X., Diankov, G., & Dai, H. (2009) · Nature · doi:10.1038/nature07919 · Cited by 2,441
How Good Can Monolayer MoS2 Transistors Be?
Yoon, Y., Ganapathi, K., & Salahuddin, S. (2011) · Nano Letters · doi:10.1021/nl2018178 · Cited by 1,528
Cited by
Liu, Y., Xiao, C., Huang, P., Cheng, M., & Xie, Y. (2018) · Chem · doi:10.1016/j.chempr.2018.02.006 · Cited by 282
Interfacial sp C–O–Mo Hybridization Originated High-Current Density Hydrogen Evolution
Yao, Y., Zhu, Y., Pan, C., Wang, C., Hu, S., Xiao, W., Chi, X., Fang, Y., Yang, J., Deng, H., et al. (2021) · Journal of the American Chemical Society · doi:10.1021/jacs.1c02831 · Cited by 250
Metadata
- Authors
- Balendhran, S., Deng, J., Ou, J. Z., Walia, S., Scott, J., Tang, J., Wang, K. L., Field, M. R., Russo, S., Zhuiykov, S., Strano, M. S., Medhekar, N., Sriram, S., Bhaskaran, M., & Kalantar‐zadeh, K.
- Venue
- Advanced Materials
- Publisher
- Wiley
- Published
- 2012-10-23
- Volume
- 25
- Issue
- 1
- Pages
- 109-114
- ISSN
- 0935-9648 (ISSN-L)
- 1521-4095
- OpenAlex
- W2020989942
- Cited by
- 406
- References
- 22
- FWCI
- 10.28
- Type
- journal article
- Language
- en
- Open access
- closed
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- Balendhran, S., Deng, J., Ou, J. Z., Walia, S., Scott, J., Tang, J., Wang, K. L., Field, M. R., Russo, S., Zhuiykov, S., Strano, M. S., Medhekar, N., Sriram, S., Bhaskaran, M., & Kalantar‐zadeh, K. (2013). Enhanced Charge Carrier Mobility in Two‐Dimensional High Dielectric Molybdenum Oxide. Advanced Materials. https://doi.org/10.1002/adma.201203346
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Contains information from the Semantic Scholar Academic Graph Datasets, made available under the ODC Attribution License (ODC-BY 1.0).
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