The DOI matches its Crossref record; 2 of the 2 references it cites were found in a registry or an index.
Digital Twin—The Simulation Aspect
Overview
Integrity signals
Registry
Cites
Statistics
Verification
Claims the paper makes
Claims other papers make about this one
Each is checked against this paper’s own text: does it say what the citing paper says it does?
In the citing paper
“However, NASA had previously employed the same concept during the Apollo program as a”
From Digital Twins in the IIoT: Current Practices and Future Directions Toward Industry 5.0 (2025) · cites this paper as [18]
In the citing paper
“It enables the evolution of physical systems into more complex digital environments by integrating software functions, such as drive and sensor connectivity within cyber-physical systems (CPS) [121].”
From Analysis of Digital Twin Applications in Energy Efficiency: A Systematic Review (2025) · cites this paper as [121]
Citations
Cites
About The Importance of Autonomy and Digital Twins for the Future of Manufacturing
Rosen, R., von Wichert, G., Lo, G., & Bettenhausen, K. D. (2015) · IFAC-PapersOnLine · doi:10.1016/j.ifacol.2015.06.141 · Cited by 1,474
Self-citationFitzwater, L. M., Torng, Y. T., & Halbert, K. (2011) · doi:10.21236/ada586666 · Cited by 1
Cited by
Sorted by citations
Digital Twin in manufacturing: A categorical literature review and classification
Kritzinger, W., Karner, M., Traar, G., Henjes, J., & Sihn, W. (2018) · IFAC-PapersOnLine · doi:10.1016/j.ifacol.2018.08.474 · Cited by 3,612
Digital twin-driven product design, manufacturing and service with big data
Tao, F., Cheng, J., Qi, Q., Zhang, M., Zhang, H., & Sui, F. (2018) · The International Journal of Advanced Manufacturing Technology · doi:10.1007/s00170-017-0233-1 · Cited by 2,920
Characterising the Digital Twin: A systematic literature review
Jones, D., Snider, C., Nassehi, A., Yon, J., & Hicks, B. (2020) · CIRP Journal of Manufacturing Science and Technology · doi:10.1016/j.cirpj.2020.02.002 · Cited by 2,422
Review of digital twin about concepts, technologies, and industrial applications
Liu, M., Fang, S., Dong, H., & Xu, C. (2020) · Journal of Manufacturing Systems · doi:10.1016/j.jmsy.2020.06.017 · Cited by 2,075
A survey on digital twin: definitions, characteristics, applications, and design implications
Barricelli, B. R., Casiraghi, E., & Fogli, D. (2019) · IEEE Access · doi:10.1109/access.2019.2953499 · Cited by 1,480
Metadata
- Authors
- Boschert, S., & Rosen, R.
- Affiliations
- Siemens (Germany) (DE)
- Corresponding author
- Boschert, Stefan
- ORCID
- Boschert, Stefan
- Venue
- Mechatronic Futures
- Publisher
- Springer International Publishing
- Published
- 2016
- Pages
- 59-74
- OpenAlex
- W2482127302
- Cited by
- 1,158
- References
- 2
- Citations by year
- 2026: 78 · 2025: 165 · 2024: 165 · 2023: 175 · 2022: 162 · 2021: 143 · 2020: 128 · 2019: 77 · 2018: 48 · 2017: 13 · 2016: 4
- FWCI
- 107.09
- Type
- book chapter
- Language
- en
- Open access
- closed
- Locations
- Springer eBooks (publishedVersion)
- Topics
- Physical Sciences › Engineering › Industrial and Manufacturing Engineering › Digital Transformation in Industry
- Physical Sciences › Mathematics › Modeling and Simulation › Modeling and Simulation Systems
- Physical Sciences › Engineering › Control and Systems Engineering › Systems Engineering Methodologies and Applications
- Keywords
- digital twin, simulation, modeling and simulation, mechatronic systems, system development, design validation, failure prediction, virtual-physical integration, product life cycle
About these checks
Registry, retraction, Cites and statistics results are computed, not judged, with one exception: a printed reference that no index lists is read once by a model before it counts as a citation error. Claims are extracted by a model and kept only when their quote appears verbatim in the text; each cited source is then checked, with a model’s help, for whether it says what the claim relies on. Those verdicts can be wrong — read the claim’s quote and the cited source before relying on one.
Statistics and arithmetic are recomputed, not judged.
Confidence bands are shown only for fields calibrated on our annotated test set. None is calibrated yet, so no band is shown.
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