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A Model-Based Standardization Approach that Separates True Bias/DIF from Group Ability Differences and Detects Test Bias/DTF as well as Item Bias/DIF

Shealy, Robin, Stout, William·1993·Psychometrika

Abstract

A model-based modification (SIBTEST) of the standardization index based upon a multidimensional IRT bias modeling approach is presented that detects and estimates DIF or item bias simultaneously for several items. A distinction between DIF and bias is proposed. SIBTEST detects bias/DIF without the usual Type 1 error inflation due to group target ability differences. In simulations, SIBTEST performs comparably to Mantel-Haenszel for the one item case. SIBTEST investigates bias/DIF for several items at the test score level (multiple item DIF called differential test functioning: DTF), thereby allowing the study of test bias/DIF, in particular bias/DIF amplification or cancellation and the cognitive bases for bias/DIF.

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Metadata

Authors
Shealy, R., & Stout, W.
Venue
Psychometrika
Published
1993-06
Volume
58
Issue
2
Pages
159-194
ISSN
  • 0033-3123 (ISSN-L)
  • 1860-0980
OpenAlex
W2092783950
Cited by
657
References
1
FWCI
20.65
Type
journal article
Language
en
Open access
closed

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