Automated visual inspection in the semiconductor industry: A survey

Cited by (307)

Items 101–200 of 307

1. The Impact of a Number of Samples on Unsupervised Feature Extraction, Based on Deep Learning for Detection Defects in Printed Circuit Boards
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2. Image-Based Defect Classification for TFT-LCD Array via Convolutional Neural Network
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3. Traceability and uncertainty of defects automated measurements by CNN-powered Machine Vision Systems
   Giacomo Maculotti, Lorenzo Giorio, Gianfranco Genta, Maurizio Galetto · 2025 · CIRP Annals
4. Low-Power Drone-Mountable Real-Time Artificial Intelligence Framework for Road Asset Classification
   Shrey Mohan, Omidreza Shoghli, Adrian Burde, Hamed Tabkhi · 2020 · Transportation Research Record Journal of the Transportation Research Board
5. Particle swarm optimization-based optimal real Gabor filter for surface inspection
   Hao Wu, Xiangrong Xu, Jinbao Chu, Li Duan, Paul Siebert · 2019 · Assembly Automation
6. Vision-Inspection-Synchronized Dual Optical Coherence Tomography for High-Resolution Real-Time Multidimensional Defect Tracking in Optical Thin Film Industry
   Deokmin Jeon, Unsang Jung, Kibeom Park, Pilun Kim, Sangyeob Han, Hyo‐Sang Jeong, Ruchire Eranga Wijesinghe, Naresh Kumar Ravichandran, Jaeyul Lee, Young‐Min Han et al. · 2020 · IEEE Access
7. Defect Contour Detection of Complex Structural Chips
   Bin Lin, Jie Wang, Xia Yang, Zhangdong Tang, Xuan Li, Cenlin Duan, Xiaohu Zhang · 2021 · Mathematical Problems in Engineering
8. Connection between micron-sized defects and dielectric strength of poly(dimethylsiloxane) elastomer films
   Hiroshi Fukui, Tsuda Takeaki, Yoichi Kaminaga, Yoonyoung Kim · 2022 · Polymer Testing
9. Automating Visual Inspection of Lyophilized Drug Products With Multi-Input Deep Neural Networks
   Calvin Tsay, Zheng Li · 2019 · IEEE International Conference on Automation Science and Engineering (CASE)
10. Image Anomaly Detection with Capsule Networks and Imbalanced Datasets
    Piciarelli, Claudio, Mishra, Pankaj, Foresti, Gian Luca · 2019 · Lecture Notes in Computer Science
11. Quality-Related Monitoring and Grading of Granulated Products by Weibull-Distribution Modeling of Visual Images with Semi-Supervised Learning
    Jinping Liu, Zhaohui Tang, Pengfei Xu, Wenzhong Liu, Jin Zhang, Jianyong Zhu · 2016 · Sensors
12. Evaluation of the Transfer Learning Models in Wafer Defects Classification
    Jessnor Arif Mat Jizat, Anwar P. P. Abdul Majeed, Ahmad Fakhri Ab. Nasir, Zahari Taha, Edmund Yuen, Lim Shi Xuen · 2021 · Lecture notes in electrical engineering
13. Deep Learning-Based Visual Recognition for Inline Defects in Production of Semiconductors
    Khouloud Limam, Shahzad Cheema, Samir Mouhoubi, Francisco Daniel Freijedo · 2023 · IEEE Journal of Emerging and Selected Topics in Industrial Electronics
14. Multi-part deviation assessment in ship assembly structures through instance segmentation
    Jian Liu, Deyu Wang · 2024 · Ocean Engineering
15. Attention Modules Improve Image-Level Anomaly Detection for Industrial Inspection: A DifferNet Case Study
    André Luiz Buarque Vieira-e-Silva, Francisco Simões, Danny Kowerko, Tobias Schlosser, Felipe Battisti, Verônica Teichrieb · 2024 · IEEE Winter Conference on Applications of Computer Vision
16. Application research on the time–frequency analysis method in the quality detection of ultrasonic wire bonding
    Wuwei Feng, Xin Chen, Cuizhu Wang, Yuzhou Shi · 2021 · International Journal of Distributed Sensor Networks
17. Modeling & Evaluating the Performance of Convolutional Neural Networks for Classifying Steel Surface Defects
    Nadeem Jabbar Chaudhry, Muhammad Bilal Khan, Muhammad Javaid Iqbal, Siddiqui Muhammad Yasir · 2022 · Journal on artificial intelligence
18. A Straightness Error Compensation System for Topography Measurement Based on Thin Film Interferometry
    Hang Su, Ruifang Ye, Fang Cheng, Changcai Cui, Qing Yu · 2021 · Photonics
19. Point Pattern Feature-Based Anomaly Detection for Manufacturing Defects, in the Random Finite Set Framework
    Ammar Mansoor Kamoona, Amirali Khodadadian Gostar, Alireza Bab‐Hadiashar, Reza Hoseinnezhad · 2021 · IEEE Access
20. Automatic Reclaimed Wafer Classification Using Deep Learning Neural Networks
    Po-Chou Shih, Chun-Chin Hsu, Fang-Chih Tien · 2020 · Symmetry
21. Vacuum Leak Detection Method Using Index Regression and Correction for Semiconductor Equipment in a Vacuum Chamber
    Taekyung Ha, Hyunjung Shin · 2021 · Applied Sciences
22. Automated visual inspection of manufactured parts using deep convolutional neural networks and transfer learning
    Karsten Weiher, Sebastian Rieck, Hannes Pankrath, Florian Beuß, Michael Geist, Jan Sender, Wilko Fluegge · 2023 · Procedia CIRP
23. Efficient surface defect detection in industrial screen printing with minimized labeling effort
    Paul Josef Krassnig, Matthias Haselmann, Michael Kremnitzer, Dieter Paul Gruber · 2024 · Integrated Computer-Aided Engineering
24. DOC$$^3$$: deep one class classification using contradictions
    Sauptik Dhar, Bernardo Gonzalez-Torres · 2023 · Machine Learning
25. The Classification of Wafer Defects: A Support Vector Machine with Different DenseNet Transfer Learning Models Evaluation
    Lim Shi Xuen, Ismail Mohd Khairuddin, Mohd Azraai Mohd Razman, Jessnor Arif Mat Jizat, Edmund Yuen, Haochuan Jiang, Eng Hwa Yap, Anwar P. P. Abdul Majeed · 2023 · Lecture notes in networks and systems
26. Surface defect classification of hot-rolled steel strip based on mixed attention mechanism
    Haonan Fan, Qin Dong, Naixuan Guo · 2023 · Robotic Intelligence and Automation
27. Implementing circularity measurements in industry 4.0-based manufacturing metrology using MQTT protocol and Open CV: A case study
    Yazid Abdullsameea Mohammed Saif, Yusri Yusof, Anika Zafiah M. Rus, Atef M. Ghaleb, Sobhi Mejjaouli, Sami Al-Alimi, Djamal Hissein Didane, Kamran Latif, Aini Zuhra Abdul Kadir, Hamood Alshalabi et al. · 2023 · PLoS ONE
28. Multi-component attention-based convolution network for color difference recognition with wavelet entropy strategy
    Jichao Zhuang, Qingjin Peng, Fenghe Wu, Baosu Guo · 2022 · Advanced Engineering Informatics
29. Waveguide quality inspection in quantum cascade lasers: A capsule neural network approach
    Abd Al Rahman M. Abu Ebayyeh, Alireza Mousavi, Sebelan Danishvar, Stéphane Blaser, Tobias Gresch, Olivier Landry, Antoine Müller · 2022 · Expert Systems with Applications
30. Full-flow surface defect identification method based on spot scanning scattering for unpatterned wafer
    Dingjun Qu, Zuoda Zhou, Zhiwei Li, Ruizhe Ding, Wei Zhu Jin, Yu Ru, Haiyan Luo, Wei Xiong · 2024 · Journal of Instrumentation
31. Deep Learning for Wafer Map Defect Detection: A Review
    Ruixuan Li, Zerui Kang · 2023 · Global Reliability and Prognostics and Health Management Conference (PHM)
32. Bayesian Nonparametric Classification for Incomplete Data With a High Missing Rate: an Application to Semiconductor Manufacturing Data
    S. Park, Kyeongwon Lee, Da-Eun Jeong, Heung-Kook Ko, Jaeyong Lee · 2023 · IEEE Transactions on Semiconductor Manufacturing
33. Utilizing Generative Adversarial Networks for Image Data Augmentation and Classification of Semiconductor Wafer Dicing Induced Defects
    Z. Y. Hu, Tobias Schlosser, Michael Friedrich, André Luiz Buarque Vieira-e-Silva, Frederik Beuth, Danny Kowerko · 2024 · IEEE International Conference on Emerging Technologies and Factory Automation (ETFA)
34. Mechanical System and Template-Matching-Based Position-Measuring Method for Automatic Spool Positioning and Loading in Welding Wire Winding
    Jie Xu, Xin He, Weixi Ji · 2020 · Applied Sciences
35. Cap-Eye-citor: A Machine Vision Inference Approach of Capacitor Detection for PCB Automatic Optical Inspection
    Julie Ann B. Susa, Erwin Mariquina, Meriam L. Tria, Cid Mathew Adolfo, Julius C. Castro · 2020 · IEEE International Conference on Engineering Technologies and Applied Sciences (ICETAS)
36. Deep learning-based automatic optical inspection system empowered by online multivariate autocorrelated process control
    Kung‐Jeng Wang, Luh Juni Asrini · 2022 · The International Journal of Advanced Manufacturing Technology
37. A framework for simulation-based engine-control unit inspection in manufacturing phase
    Won K. Ham, Minsuk Ko, Sang C. Park · 2016 · Control Engineering Practice
38. Optimal Path Planning for Image Based Visual Servoing
    Mark S Allen, Ethan Westcoat, Laine Mears · 2019 · Procedia Manufacturing
39. Simulation of semiconductor wafer dicing induced faults on chips and their application as augmentation method for a deep learning based visual inspection system
    Michael Friedrich, Tobias Schlosser, Danny Kowerko · 2025 · Journal of Intelligent Manufacturing
40. Defect Detection of Metal Nuts Applying Convolutional Neural Networks
    Daniel Sauter, A. Schmitz, Fulya Dikici, Hermann Baumgartl, Ricardo Buettner · 2021 · IEEE Annual International Computer Software and Applications Conference (COMPSAC)
41. Intelligent evaluation for lens optical performance based on machine vision
    Zhonghe Ren, Fengzhou Fang, Zihao Li, Rui Xia Niu · 2022 · Optics Express
42. Defect inspection in semiconductor images using FAST-MCD method and neural network
    Jinkyu Yu, Song‐Hee Han, Chang-Ock Lee · 2023 · The International Journal of Advanced Manufacturing Technology
43. Utilizing Deep Learning for Defect Inspection in Hand Tool Assembly
    Hong-Dar Lin, Cheng-Kai Jheng, Chou-Hsien Lin, Hung-Tso Chang · 2024 · Sensors
44. Automated Detection and Classification of Defective and Abnormal Dies in Wafer Images
    Hsiang-Chieh Chen · 2020 · Applied Sciences
45. Gigapixel confocal imaging using a massively parallel optical probe array with single directional infinite scanning
    Ryung Shin, Woojae Choi, Taekyung Kim, Donghyun Kim, Runjia Han, Kyungjin Lee, Nahyun Won, Shinill Kang · 2020 · Scientific Reports
46. Machine learning for analyzing and characterizing InAsSb-based nBn photodetectors
    Andreu Glasmann, Alexandros Kyrtsos, E. Bellotti · 2020 · Machine Learning Science and Technology
47. The study of a novel control method of the mood lighting emulator
    Kechun Lin, Chern‐Sheng Lin · 2015 · Optics Communications
48. Computational characterization of ordered nanostructured surfaces
    Nasser Mohieddin Abukhdeir · 2016 · Materials Research Express
49. Creation of image models for inspecting visual flaws on capacitive touch screens
    Chiu Yuan-Shyi, Hong-Dar Lin · 2018 · Istrazivanja i projektovanja za privredu
50. OIAD: One-for-all Image Anomaly Detection with Disentanglement Learning
    Shuo Wang, Tianle Chen, Shangyu Chen, ‪Surya Nepal‬, Carsten Rudolph, Marthie M. Grobler · 2020 · International Joint Conference on Neural Networks (IJCNN)
51. Hybrid Semiconductor Wafer Inspection Framework via Autonomous Data Annotation
    Changheon Han, Heebum Chun, Jiho Lee, Fengfeng Zhou, Huitaek Yun, ChaBum Lee, Martin Byung‐Guk Jun · 2024 · Journal of Manufacturing Science and Engineering
52. High-Resolution Guided Up-Sampling Edge-Enhancing Semantic Segmentation Network for Semiconductor Wafer Surface Defect Detection
    Jiangtao Cheng, Shuang Mei, Xingyue Liu, Xin He, Guojun Wen · 2025 · IEEE Sensors Journal
53. Robust Control Chart Application in Semiconductor Manufacturing Process
    Sufinah Dahari, Muzalwana Abdul Talib, Adilah Abdul Ghapor · 2024 · Journal of Advanced Research in Applied Sciences and Engineering Technology
54. A Novel Approach to Test-Induced Defect Detection in Semiconductor Wafers, Using Graph-Based Semi-Supervised Learning (GSSL)
    Pedram Tabatabaeemoshiri, Narendra Kumar Aridas, Anis Salwa Mohd Khairuddin, Daniel Ting, Vivek Regeev · 2025 · IEEE Access
55. Supervised Anomaly Detection with Highly Imbalanced Datasets Using Capsule Networks
    Claudio Piciarelli, Pankaj Kumar Mishra, Gian Luca Foresti · 2021 · International Journal of Pattern Recognition and Artificial Intelligence
56. Visual Testing for Fiber-Reinforced Composite Materials
    Shuncong Zhong A, Walter Nsengiyumva · 2022 · Springer eBooks
57. Automated Quality Inspection of PCB Assembly Using Image Processing
    Punith Kumar M B, T. Shreekanth, M R Prajwal · 2020 · International Journal of Image Graphics and Signal Processing
58. Steel surface in-line inspection using machine vision
    Hsiao-Wei Liu, Yu-Ying Lan, Han-Wen Lee, Ding-Kun Liu · 2016 · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE
59. Vision-Based Measurement for Quality Control Inspection Integrated Into a Die-Casting Process in Industry 4.0 Era
    Rômulo Gonçalves Lins, Reinaldo Eduardo dos Santos, Ricardo Gaspar · 2025 · IEEE Access
60. From Wafers to Electrodes: Transferring Automatic Optical Inspection (AOI) for Multiscale Characterization of Smart Battery Manufacturing
    Jianyu Li, Ertao Hu, Wei Wei, Feifei Shi · 2026 · Advanced Functional Materials
61. Fed-SEMI: A Federated Machine Learning Framework for Nano-Scale Defect Classification and Detection in Semiconductor Manufacturing with Decentralized and Private Data
    Bappaditya Dey, Jacob Deforce, Victor Blanco, Sandip Halder, Philippe J. Leray · 2024 · International Symposium ELMAR (ELMAR)
62. Remote Reflectivity Sensor for Industrial Applications
    Federico Cavedo, Parisa Esmaili, Michele Norgia · 2021 · Sensors
63. Algorithms for Vision-Based Quality Control of Circularly Symmetric Components
    Paolo Brambilla, Chiara Conese, Davide Maria Fabris, Paolo Chiariotti, Marco Tarabini · 2023 · Sensors
64. Rotation Estimation and Segmentation for Patterned Image Vision Inspection
    Cheonin Oh, Hyungwoo Kim, Hyeonjoong Cho · 2021 · Electronics
65. Machine Vision Based Smart Machining System Monitoring
    Kunpeng Zhu · 2021 · Springer series in advanced manufacturing
66. Automatic detection of defects in electronic plastic packaging using deep convolutional neural networks
    Wanchun Ren, Pengcheng Zhu, Shaofeng Cai, Yi Huang, Haoran Zhao, Youji Hama, Zhu Yan, Tao Zhou, Junde Pu, Hongwei Yang · 2024 · Journal of Real-Time Image Processing
67. A Novel Multi-Scale Feature Learning-Based Residual Network Improves Semiconductor Wafer Defect Classification Accuracy
    Can Ma, Yiming Yao, Luyang Jie, Lilei Hu · 2023 · International Workshop on Advanced Patterning Solutions (IWAPS)
68. A compact Robot-based defect detection device design for silicon wafer
    Xiaoyan Chen, Chundong Zhao, Jianyong Chen, Dongyang Zhang, Kuifeng Zhu, Yanjie Su · 2020 · Journal of Physics Conference Series
69. An approach for designing smart manufacturing for the research and development of dye-sensitize solar cell
    Jorge L. Alonso-Perez, Selene Lilette Cardenas-Maciel, Balter Trujillo-Navarrete, Edgar Alonso Reynoso‐Soto, Nohe Ramon Cazarez-Castro · 2021 · Journal of Intelligent Manufacturing
70. Automated visual inspection and defect detection of large-scale silicon strip sensors
    K. Affolder, Alessandra Ciocio, E. W. Cornell, V. Fadeyev, Z. Luce, Jacob R. Gunnell, F. Martinez-Mckinney, T. Johnson, R. MacFadyen, Anne-luise Poley et al. · 2022 · Journal of Instrumentation
71. DAP-SDD: Distribution-Aware Pseudo Labeling for Small Defect Detection
    Xiaoyan Zhuo, Wolfgang Rahfeldt, Xiaoqian Zhang, Ted Doros, Seung Woo Son · 2022
72. Metrology Process to Produce High-Value Components and Reduce Waste for the Fourth Industrial Revolution
    Ahmad Junaid, Muftooh Ur Rehman Siddiqi, Sundas Tariq, Riaz Muhammad, Ubaidullah Paracha, Nasim Ullah, Ahmad Al Ahmadi, Muhammad Suleman, Tufail Habib · 2022 · Sustainability
73. Automated Vision Inspection of Critical Steel Components based on Signal Analysis Extracted form Images
    Paolo Brambilla, P. W. Cattaneo, Andrea Fumagalli, Paolo Chiariotti, Marco Tarabini · 2022 · IEEE International Workshop on Metrology for Industry 4.0 & IoT (MetroInd4.0&IoT)
74. Automated Optical Inspection for Printed Circuit Board Assembly Manufacturing with Transfer Learning and Synthetic Data Generation
    Syed Saad Saif, Kerem Aras, Alessandro Giuseppi · 2022 · Mediterranean Conference on Control and Automation (MED)
75. Spatial Concentration in Relation to Industrial Resilience
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76. Automated X-ray Defect Inspection on Occluded BGA Balls Using Hybrid Algorithm
    Ki-Yeol Eom, Byungseok Min · 2023 · Computers, materials & continua/Computers, materials & continua (Print)
77. Effective image models for inspecting profile flaws of car mirrors with applications
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78. Impact of Image Sensor Output Data on Power Consumption of the Image Processing System
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79. Optimal modified lateral shearing interferometer for submicro-defects measurement of transparent objects
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80. Automatic Optical Inspection of Solder Ball Burn Defects on Head Gimbal Assembly
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81. Cotton Melange Yarn and Image Processing
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82. A Deep Learning Framework for Modeling Temporal Dependencies and Hierarchies in Hourly Electricity Demand Load
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83. Measuring and evaluating the differences of compared images for a correct car silhouette categorization using integral transforms
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84. Enhancing the Automated Quality Inspection in Manufacturing Process through Parameter Optimization
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85. CAD2Real: Deep learning with domain randomization of CAD data for 3D pose estimation of electronic control unit housings
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86. Multitrack Compressed Sensing for Faster Hyperspectral Imaging
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87. FPGA IMPLEMENTATION OF CNN FOR DEFECT CLASSIFICATION ON CMP RING
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88. Chamber in-situ estimation during etching process by SiF4 monitoring using laser absorption spectroscopy
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89. Design and development of an Automatic Optical Inspection (AOI) system support based on digital manufacturing
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90. Efficient and Precise Detection of Surface Defects on PCBs: A YOLO Based Approach
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91. Apple Spots and Defects Detection Based on Machine Vision, Fuzzy Systems, and Improved Gray Wolf Optimization Algorithm
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92. Improved Surface Defect Classification from a Simple Convolutional Neural Network by Image Preprocessing and Data Augmentation
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93. Color Difference Detection of Polysilicon Wafers Using Optimized Support Vector Machine by Magnetic Bacteria Optimization Algorithm With Elitist Strategy
    Baosu Guo, Jichao Zhuang, Yukang Wu, Wenwen Wu, Fenghe Wu, Qingjin Peng · 2020 · IEEE Transactions on Semiconductor Manufacturing
94. Affinity Propagation Clustering for Intelligent Portfolio Diversification and Investment Risk Reduction
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95. A quality quantitative method of silicon direct bonding based on wavelet image analysis
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96. Robust, Cheap and Efficient Vision System for Mechanical Thermostat Switch Sub-assembly Inspection
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97. Rapid and precise characterization of sub-µm surface defects using laser scatterometer devising a polygonal-shaped waveguide with double-slit aperture
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98. High-Throughput Image-Guided Microprobe Mass Spectrometric Analysis of Single Cells
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99. Data Augmentation via Mixed Class Interpolation using Cycle-Consistent Generative Adversarial Networks Applied to Cross-Domain Imagery
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100. Vehicular Mini-LED backlight display inspection based on residual global context mechanism
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