Automated visual inspection in the semiconductor industry: A survey

Cited by (307)

Items 301–307 of 307

1. Data-Efficient Semiconductor Wafer Defect Identification Using WGAN-GP Augmentation and Lightweight Deep Convolutional Networks
   Adarsh Prakash, Umang Patwari, Swaroop Warade, Akash Kumar Kumar Pradhan, Bibhuti Bhusan Pradhan · 2026 · IEEE Access
2. Automated PCB Defect Detection Using YOLOv8 for Optical Inspection
   S. Meenakshi, Abhiprakash R, Drizzle M · 2026 · International Conference on Modern Sustainable Systems (CMSS)
3. Research on anisotropic flexible magnetic sensing arrays based on magnetic anisotropic conductive network reconstruction
   Meng Li, Xinqi Gong, Yu Cao, Junran Chen, Deping Liu, Bin Liu, Guosheng Xia, Jian Ren · 2026 · Measurement
4. Quantitative Optimization of Optical Beam Alignment for Throughput Enhancement in Dark-Field Wafer Inspection Systems
   Hyoseop Shin, Dongkun Shin · 2026 · Photonics
5. Automated Detection of Probe Needle Tips in Semiconductor Inspection Images Using Density-Based Clustering
   Kirill Danilin, Evgeny A. Semenishchev · 2026 · International Russian Automation Conference (RusAutoCon)
6. Machine learning approaches to fault detection in circuit design
   Goutam Majumder, Samim Aktar, Ganesh S. Khekare · 2026 · Elsevier eBooks
7. An annotation-efficient parallel processing framework for robust defect detection in TFT-LCD manufacturing
   Muhammad Irshad, Poorya Khanali, Sameed Sajid, Martin Wanly, Susanna Weber, Benny Drescher, Chang Liu, ASM Ashraf Mahmud · 2026 · Results in Engineering