The DOI matches its Crossref record; 9 of the 9 references it cites were found in a registry or an index.
A review: On the development of low melting temperature Pb-free solders
Overview
The claims and statistics of this paper haven’t been checked yet.
Run the check — free, no account needed. It reads the open-access text and checks the sources it cites.
Integrity signals
Registry
Cites
Statistics
Verification
Claims the paper makes
The claims and statistics of this paper haven’t been checked yet.
Run the check — free, no account needed. It reads the open-access text and checks the sources it cites.
Self-check
Percentages, sums and reported differences re-computed from the paper’s own numbers.
The self-check needs the paper’s full text.
Citations
Cites
(2016) · Alloy Phase Diagrams · doi:10.31399/asm.hb.v03.a0006247 · Cited by 16,046
Hansen, M., Anderko, K., & Salzberg, H. W. (1958) · Journal of The Electrochemical Society · doi:10.1149/1.2428700 · Cited by 14,782
Lead-free Solders in Microelectronics
Abtew, M., & Selvaduray, G. (2000) · Materials Science and Engineering: R: Reports · doi:10.1016/s0927-796x(00)00010-3 · Cited by 1,968
Interfacial reactions between lead-free solders and common base materials
Laurila, T. T., Vuorinen, V., & Kivilahti, J. K. (2005) · Materials Science and Engineering R Reports · doi:10.1016/j.mser.2005.03.001 · Cited by 1,109
Tin–lead (SnPb) solder reaction in flip chip technology
Tu, K. N., & Zeng, K. (2001) · Materials Science and Engineering: R: Reports · doi:10.1016/s0927-796x(01)00029-8 · Cited by 595
Electrical Contacts: Fundamentals, Applications and Technology
Braunović, M., Myshkin, N. K., & Konchits, V. V. (2006) · Cited by 376
Scallop formation and dissolution of Cu–Sn intermetallic compound during solder reflow
Ma, D., Wang, W. D., & Lahiri, S. K. (2002) · Journal of Applied Physics · doi:10.1063/1.1445283 · Cited by 144
Swenson, D. (2006) · Journal of Materials Science Materials in Electronics · doi:10.1007/s10854-006-9012-8 · Cited by 71
Cho, M. G., Kim, H. Y., Seo, S.-K., & Lee, H. M. (2009) · Applied Physics Letters · doi:10.1063/1.3177335 · Cited by 43
Cited by
A review of lead-free solders for electronics applications
Cheng, S., Huang, C.-M., & Pecht, M. (2017) · Microelectronics Reliability · doi:10.1016/j.microrel.2017.06.016 · Cited by 523
Novel nanostructured thermal interface materials: a review
Hansson, J., Nilsson, T. M. J., Ye, L., & Liu, J. (2018) · International Materials Reviews · doi:10.1080/09506608.2017.1301014 · Cited by 441
Low temperature thin films for next-generation microelectronics (invited)
Schmitz, J. (2018) · Surface and Coatings Technology · doi:10.1016/j.surfcoat.2017.11.013 · Cited by 103
Metadata
- Authors
- Kotadia, H. R., Howes, P. D., & Mannan, S. H.
- Venue
- Microelectronics Reliability
- Publisher
- Elsevier BV
- Published
- 2014-06
- Volume
- 54
- Issue
- 6-7
- Pages
- 1253-1273
- ISSN
- 0026-2714 (ISSN-L)
- OpenAlex
- W1968459445
- Cited by
- 476
- References
- 9
- FWCI
- 14.86
- Type
- journal article
- Language
- en
- Open access
- closed
About these checks
Registry, retraction, Cites and statistics results are computed, not judged, with one exception: a printed reference that no index lists is read once by a model before it counts as a citation error. Claims are extracted by a model and kept only when their quote appears verbatim in the text; each cited source is then checked, with a model’s help, for whether it says what the claim relies on. Those verdicts can be wrong — read the claim’s quote and the cited source before relying on one.
Statistics and arithmetic are recomputed, not judged.
Confidence bands are shown only for fields calibrated on our annotated test set. None is calibrated yet, so no band is shown.
What counts as a claim ›How we measure confidence ›How we check this ›
Are you an author, or do you see a problem with this page? Request a review
How to cite
Cite CoChat for the checks on this page, and the paper for its own findings.
- This page
- CoChat. (2026). Citation check: A review: On the development of low melting temperature Pb-free solders. https://app.cochat.ai/papers/10.1016/j.microrel.2014.02.025
- The paper
- Kotadia, H. R., Howes, P. D., & Mannan, S. H. (2014). A review: On the development of low melting temperature Pb-free solders. Microelectronics Reliability. https://doi.org/10.1016/j.microrel.2014.02.025
Data sources
Bibliographic data: Semantic Scholar, OpenAlex, Crossref.
Contains information from the Semantic Scholar Academic Graph Datasets, made available under the ODC Attribution License (ODC-BY 1.0).
Semantic Scholar’s data is described in: Kinney, R., et al. (2023). The Semantic Scholar Open Data Platform. arXiv:2301.10140.