Cited by 17Terahertz technology and applicationsLaser-Matter Interactions and ApplicationsSpectroscopy and Laser Applications

Experimental Gouy phase shift compensation in Terahertz time-domain spectroscopy

Koleják, Pierre, Postava, Kamil, Mičica, Martin, Kužel, Petr, Kadlec, Filip, Pištora, Jaromír·2018·Photonics and Nanostructures - Fundamentals and Applications

Integrity signals

Registry

Crossref · 10.1016/j.photonics.2018.06.011

Cites

12 of 12 references verified0 citation errors · 0 not checkable

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  • The induced relatively larger Gouy phase shift for biconvex tablets introduces significant uncertainty in the extracted refractive index.

    “The induced relatively larger Gouy phase shift for the biconvex tablets will introduce a significant uncertainty in the extracted refractive index [50, 51].”

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Authors
Koleják, P., Postava, K., Mičica, M., Kužel, P., Kadlec, F., & Pištora, J.
Affiliations
  • VSB - Technical University of Ostrava (CZ)
  • Czech Academy of Sciences (CZ)
Corresponding author
Koleják, Pierre
Venue
Photonics and Nanostructures - Fundamentals and Applications
Publisher
Elsevier BV
Published
2018-09
Volume
31
Pages
129-133
ISSN
1569-4410 (ISSN-L)
OpenAlex
W2810608481
Cited by
17
References
12
Citations by year
2026: 2 · 2025: 3 · 2024: 2 · 2023: 1 · 2022: 4 · 2021: 2 · 2020: 1 · 2019: 1 · 2018: 1
FWCI
0.48
Type
journal article
Language
en
Open access
closed
Locations
  • Photonics and Nanostructures - Fundamentals and Applications (publishedVersion)
  • DSpace VŠB-TUO (VŠB-TUO) (submittedVersion)
Funders
Grantová Agentura České Republiky (SP2017/154, CZ 02.1.01/0.0/0.0/16_013/0001791, LQ1602)
Topics
  • Physical Sciences › Engineering › Electrical and Electronic Engineering › Terahertz technology and applications
  • Physical Sciences › Physics and Astronomy › Atomic and Molecular Physics, and Optics › Laser-Matter Interactions and Applications
  • Physical Sciences › Chemistry › Spectroscopy › Spectroscopy and Laser Applications
Keywords
Gouy phase, terahertz time-domain spectroscopy, phase compensation, dielectric spectra, focused beams, thick samples

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