Cited by 1Strong Light-Matter InteractionsSemiconductor Quantum Structures and DevicesPhotonic and Optical Devices

Control of Rabi Splitting Energies in CuCl Microcavities with HfO2/SiO2 Distributed Bragg Reflectors

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Nakayama, M., Miyazaki, K., Kawase, T., Kim, D.·2012·Physics Procedia

Abstract

The exciton-photon interaction in CuCl microcavities with HfO2/SiO2 distributed Bragg reflectors has been investigated from the viewpoint of the active-layer-thickness dependence of the interaction energy, the so-called vacuum Rabi splitting energy. The active layer thickness was changed from A/32 to A/5, where A corresponds to an effective resonant wavelength of the lowest-lying Z3 exciton. We performed angle-resolved reflectance measurements, and clearly detected three cavity-polariton modes originating from the lower, middle, and upper polariton branches in a strong coupling regime of the Z3 and Z1,2 excitons, and cavity photon. The incidence-angle dependence of the cavity-polariton energies was analyzed with a phenomenological Hamiltonian for the strong coupling. The vacuum Rabi splitting energies are systematically controlled from 22 (37) to 68 (122) meV for the Z3 (Z1,2) exciton with an increase in the active layer thickness. The active-layer-thickness dependence of the Rabi splitting energy is quantitatively explained using a simple model for quantum-well microcavities.

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Crossref · 10.1016/j.phpro.2012.03.683

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  • Microcavities allow precise control of the optical response in the regime of strong exciton-photon coupling, leading to the formation of exciton-polaritons.

    “Intensive studies have been carried out in recent years due to their capability of allowing precise control of the optical response in the regime of strong exciton-photon coupling, leading to the formation of a composite quasiparticle, namely exciton-polaritons, in the cavity [263].”

    From Metal Oxide Thin Films for Advanced Photonic Applications (2026) · cites this paper as [263]

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  1. For a review, A. V. Kavokin, J. J. Baumberg, G. Malpuech, and F. P. Laussy: Microcavities (Oxford University Press, Oxford, 2007). Active layer thickness (in units of O) Rabi splitting energy (meV)
  2. M. Ueta, H. Kanzaki, K. Kobayashi, Y. Toyozawa, and E. Hanamura: Excitonic Processes in Solids (Springer, New York, 1986) p. 116.

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Authors
Nakayama, M., Miyazaki, K., Kawase, T., & Kim, D.
Affiliations
Osaka City University (JP)
Corresponding author
Nakayama, M.
Venue
Physics Procedia
Publisher
Elsevier BV
Published
2012
Volume
29
Pages
6-11
ISSN
1875-3892 (ISSN-L)
OpenAlex
W1965127312
Cited by
0
References
16
FWCI
0.00
Type
journal article
Language
en
Open access
Locations
Physics Procedia (publishedVersion, cc-by-nc-nd)
Funders
Japan Society for the Promotion of Science (22340084)
Topics
  • Physical Sciences › Physics and Astronomy › Atomic and Molecular Physics, and Optics › Strong Light-Matter Interactions
  • Physical Sciences › Physics and Astronomy › Atomic and Molecular Physics, and Optics › Semiconductor Quantum Structures and Devices
  • Physical Sciences › Engineering › Electrical and Electronic Engineering › Photonic and Optical Devices
Keywords
vacuum Rabi splitting, exciton-photon coupling, strong coupling, angle-resolved reflectance

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