The DOI matches its Crossref record; 4 of the 4 references it cites were found in a registry or an index.
Contact resistance in graphene-based devices
Open accessAbstract
We report a systematic study of the total contact resistance present at the interface between a metal (Ti) and graphene layers of different, known thickness. By comparing devices fabricated on many different graphene flakes we demonstrate that the contact resistance consists of a gate independent and a gate dependent part. We show that quantitatively the gate independent part of the contact resistance is the same for single-, bi-, and tri-layer graphene. We argue that this is the result of charge transfer from the metal, causing the Fermi level in the graphene region under the contacts to shift far away from the charge neutrality point.
Overview
The claims and statistics of this paper haven’t been checked yet.
Run the check — free, no account needed. It reads the open-access text and checks the sources it cites.
Integrity signals
Registry
Cites
Statistics
Verification
Claims the paper makes
The claims and statistics of this paper haven’t been checked yet.
Run the check — free, no account needed. It reads the open-access text and checks the sources it cites.
Self-check
Percentages, sums and reported differences re-computed from the paper’s own numbers.
The self-check needs the paper’s full text.
Citations
Cites
Two-dimensional gas of massless Dirac fermions in graphene
Novoselov, K. S., Geim, A. K., Morozov, S. V., Jiang, D., Katsnelson, M. I., Grigorieva, I. V., Dubonos, S. V., & Firsov, A. A. (2005) · Nature · doi:10.1038/nature04233 · Cited by 21,611
Chiral tunnelling and the Klein paradox in graphene
Katsnelson, M. I., Novoselov, K. S., & Geim, A. K. (2006) · Nature Physics · doi:10.1038/nphys384 · Cited by 3,896
Biased Bilayer Graphene: Semiconductor with a Gap Tunable by the Electric Field Effect
Castro, E. V., Novoselov, K. S., Morozov, S. V., Peres, N. M. R., dos Santos, J. M. B. L., Nilsson, J., Guinea, F., Geim, A. K., & Neto, A. H. C. (2007) · Physical Review Letters · doi:10.1103/physrevlett.99.216802 · Cited by 2,033
Asymmetry gap in the electronic band structure of bilayer graphene
McCann, E. (2006) · Physical Review B · doi:10.1103/physrevb.74.161403 · Cited by 1,275
Cited by
The origins and limits of metal–graphene junction resistance
Xia, F., Perebeinos, V., Lin, Y.-M., Wu, Y., & Avouris, P. (2011) · Nature Nanotechnology · doi:10.1038/nnano.2011.6 · Cited by 832
Graphene-Silicon Schottky Diodes
Chen, C.-C., Aykol, M., Chang, C.-C., Levi, A. F. J., & Cronin, S. B. (2011) · Nano Letters · doi:10.1021/nl104364c · Cited by 485
Selective Gas Sensing with a Single Pristine Graphene Transistor
Rumyantsev, S., Liu, G., Shur, M. S., Potyrailo, R. A., & Balandin, A. A. (2012) · Nano Letters · doi:10.1021/nl3001293 · Cited by 408
Metadata
- Authors
- Russo, S., Craciun, M. F., Yamamoto, M., Morpurgo, A. F., & Tarucha, S.
- Venue
- Physica E: Low-dimensional Systems and Nanostructures
- Publisher
- Elsevier BV
- Published
- 2010-02
- Volume
- 42
- Issue
- 4
- Pages
- 677-679
- ISSN
- 1386-9477 (ISSN-L)
- OpenAlex
- W2026435243
- Cited by
- 202
- References
- 4
- FWCI
- 9.09
- Type
- journal article
- Language
- en
- Open access
- green
About these checks
Registry, retraction, Cites and statistics results are computed, not judged, with one exception: a printed reference that no index lists is read once by a model before it counts as a citation error. Claims are extracted by a model and kept only when their quote appears verbatim in the text; each cited source is then checked, with a model’s help, for whether it says what the claim relies on. Those verdicts can be wrong — read the claim’s quote and the cited source before relying on one.
Statistics and arithmetic are recomputed, not judged.
Confidence bands are shown only for fields calibrated on our annotated test set. None is calibrated yet, so no band is shown.
What counts as a claim ›How we measure confidence ›How we check this ›
Are you an author, or do you see a problem with this page? Request a review
How to cite
Cite CoChat for the checks on this page, and the paper for its own findings.
- This page
- CoChat. (2026). Citation check: Contact resistance in graphene-based devices. https://app.cochat.ai/papers/10.1016/j.physe.2009.11.080
- The paper
- Russo, S., Craciun, M. F., Yamamoto, M., Morpurgo, A. F., & Tarucha, S. (2010). Contact resistance in graphene-based devices. Physica E: Low-dimensional Systems and Nanostructures. https://doi.org/10.1016/j.physe.2009.11.080
Data sources
Bibliographic data: Semantic Scholar, OpenAlex, Crossref.
Contains information from the Semantic Scholar Academic Graph Datasets, made available under the ODC Attribution License (ODC-BY 1.0).
Semantic Scholar’s data is described in: Kinney, R., et al. (2023). The Semantic Scholar Open Data Platform. arXiv:2301.10140.