The DOI matches its Crossref record; 35 of the 35 references it cites were found in a registry or an index.
Si-N membrane-based microcalorimetry: Heat capacity and thermal conductivity of thin films
Overview
The claims and statistics of this paper haven’t been checked yet.
Run the check — free, no account needed. It reads the open-access text and checks the sources it cites.
Integrity signals
Registry
Cites
Statistics
Verification
Claims the paper makes
The claims and statistics of this paper haven’t been checked yet.
Run the check — free, no account needed. It reads the open-access text and checks the sources it cites.
Self-check
Percentages, sums and reported differences re-computed from the paper’s own numbers.
The self-check needs the paper’s full text.
Citations
Cites
Thermal Conductivity and Specific Heat of Noncrystalline Solids
Zeller, R. C., & Pohl, R. O. (1971) · Physical Review B · doi:10.1103/physrevb.4.2029 · Cited by 1,954
Size-Dependent Melting Properties of Small Tin Particles: Nanocalorimetric Measurements
Lai, S. L., Guo, J. Y., Petrova, V., Ramanath, G., & Allen, L. H. (1996) · Physical Review Letters · doi:10.1103/physrevlett.77.99 · Cited by 898
Heat transport in thin dielectric films
Lee, S.-M., & Cahill, D. G. (1997) · Journal of Applied Physics · doi:10.1063/1.363923 · Cited by 732
Heat Capacity Measurements on Small Samples at Low Temperatures
Bachmann, R., DiSalvo, F. J., Geballe, T. H., Greene, R. L., Howard, R. E., King, C. N., Kirsch, H. C., Lee, K. N., Schwall, R. E., Thomas, H.-U., et al. (1972) · Review of Scientific Instruments · doi:10.1063/1.1685596 · Cited by 556
Lattice Vibrations and Heat Transport in Crystals and Glasses
Cahill, D. G., & Pohl, R. O. (1988) · Annual Review of Physical Chemistry · doi:10.1146/annurev.pc.39.100188.000521 · Cited by 468
Low-temperature thermal conductivity and acoustic attenuation in amorphous solids
Pohl, R. O., Liu, X., & Thompson, E. (2002) · Reviews of Modern Physics · doi:10.1103/revmodphys.74.991 · Cited by 390
Kim, D., Revaz, B., Zink, B. L., Hellman, F., Rhyne, J. J., & Mitchell, J. F. (2002) · Physical Review Letters · doi:10.1103/physrevlett.89.227202 · Cited by 319
Self-citationTunneling Systems in Amorphous and Crystalline Solids
Esquinazi, P. D. (1998) · Springer eBooks · doi:10.1007/978-3-662-03695-2 · Cited by 311
Thin film microcalorimeter for heat capacity measurements from 1.5 to 800 K
Denlinger, D. W., Abarra, E. N., Allen, K., Rooney, P. W., Messer, M. T., Watson, S. K., & Hellman, F. (1994) · Review of Scientific Instruments · doi:10.1063/1.1144925 · Cited by 248
Self-citationScanning microcalorimetry at high cooling rate
Adamovsky, S. A., Minakov, A. A., & Schick, C. (2003) · Thermochimica Acta · doi:10.1016/s0040-6031(03)00182-5 · Cited by 245
Research works printed but not linked: 6
- Junod, 1996, vol. 19, 1
- B.L. Zink, Ph.D. thesis, University of California at San Diego, 2002.
- B.L. Zink, Ph.D. thesis, University of California at San Diego, 2002.
- K. Allen, Ph.D. thesis, University of California at San Diego, 1998.
- Guzman, 1976, Inorg. Mater., 12, 1546
- S. Wenzel, Ph.D. thesis, University of California, Berkeley, 1992.
Cited by
Thermal Conductivity and Specific Heat of Thin-Film Amorphous Silicon
Zink, B. L., Pietri, R., & Hellman, F. (2006) · Physical Review Letters · doi:10.1103/physrevlett.96.055902 · Cited by 162
Self-citationThin film nanocalorimeter for heat capacity measurements of 30 nm films
Queen, D., & Hellman, F. (2009) · Review of Scientific Instruments · doi:10.1063/1.3142463 · Cited by 94
Self-citationExcess Specific Heat in Evaporated Amorphous Silicon
Queen, D., Liu, X., Karel, J., Metcalf, T., & Hellman, F. (2013) · Physical Review Letters · doi:10.1103/physrevlett.110.135901 · Cited by 78
Self-citationMagnetocaloric effect in nanoscale thin films and heterostructures
Miller, C. W., Belyea, D. D., & Kirby, B. J. (2014) · Journal of Vacuum Science & Technology A Vacuum Surfaces and Films · doi:10.1116/1.4882858 · Cited by 77
McCluskey, P. J., & Vlassak, J. J. (2010) · Journal of materials research/Pratt's guide to venture capital sources · doi:10.1557/jmr.2010.0286 · Cited by 67
Metadata
- Authors
- Revaz, B., Zink, B. L., & Hellman, F.
- Affiliations
- University of Geneva (CH)
- National Institute of Standards and Technology (US)
- University of California, Berkeley (US)
- Corresponding author
- Revaz, B.
- Venue
- Thermochimica Acta
- Publisher
- Elsevier BV
- Published
- 2005-07
- Volume
- 432
- Issue
- 2
- Pages
- 158-168
- ISSN
- 0040-6031 (ISSN-L)
- OpenAlex
- W2021630007
- Cited by
- 43
- References
- 35
- Citations by year
- 2025: 1 · 2024: 2 · 2023: 1 · 2019: 1 · 2017: 1 · 2016: 1 · 2015: 4 · 2014: 3 · 2013: 5 · 2012: 3
- FWCI
- 1.95
- Type
- journal article
- Language
- en
- Open access
- closed
- Licence
- www.elsevier.com/tdm/userlicense/1.0/ (tdm)
- Locations
- Thermochimica Acta (publishedVersion)
- Funders
- National Science Foundation
- U.S. Department of Energy
- Topics
- Physical Sciences › Chemistry › Physical and Theoretical Chemistry › thermodynamics and calorimetric analyses
- Physical Sciences › Chemistry › Organic Chemistry › Chemical Thermodynamics and Molecular Structure
- Physical Sciences › Materials Science › Materials Chemistry › Thermal properties of materials
- Keywords
- microcalorimetry, silicon nitride membranes, thin films, heat capacity, thermal conductivity, silicon micromachining, thin film heaters, thermometers, relaxation techniques, high magnetic fields, microgram samples, powder sample
About these checks
Registry, retraction, Cites and statistics results are computed, not judged, with one exception: a printed reference that no index lists is read once by a model before it counts as a citation error. Claims are extracted by a model and kept only when their quote appears verbatim in the text; each cited source is then checked, with a model’s help, for whether it says what the claim relies on. Those verdicts can be wrong — read the claim’s quote and the cited source before relying on one.
Statistics and arithmetic are recomputed, not judged.
Confidence bands are shown only for fields calibrated on our annotated test set. None is calibrated yet, so no band is shown.
What counts as a claim ›How we measure confidence ›How we check this ›
Are you an author, or do you see a problem with this page? Request a review
How to cite
Cite CoChat for the checks on this page, and the paper for its own findings.
- This page
- CoChat. (2026). Citation check: Si-N membrane-based microcalorimetry: Heat capacity and thermal conductivity of thin films. https://app.cochat.ai/papers/10.1016/j.tca.2005.04.004
- The paper
- Revaz, B., Zink, B. L., & Hellman, F. (2005). Si-N membrane-based microcalorimetry: Heat capacity and thermal conductivity of thin films. Thermochimica Acta. https://doi.org/10.1016/j.tca.2005.04.004
Data sources
Bibliographic data: Semantic Scholar, OpenAlex, Crossref.
Contains information from the Semantic Scholar Academic Graph Datasets, made available under the ODC Attribution License (ODC-BY 1.0).
Semantic Scholar’s data is described in: Kinney, R., et al. (2023). The Semantic Scholar Open Data Platform. arXiv:2301.10140.
