Cited by 62Advanced Thermoelectric Materials and DevicesChalcogenide Semiconductor Thin FilmsPhase-change materials and chalcogenides

Electrical and thermoelectrical properties of Bi2Se3 grown by metal organic chemical vapour deposition technique

Al Bayaz, A., Giani, A., Foucaran, A., Pascal-Delannoy, F., Boyer, A.·2003·Thin Solid Films

Integrity signals

Registry

Crossref · 10.1016/s0040-6090(03)00675-8

Cites

20 of 20 references verified0 citation errors · 0 not checkable

Statistics

Recomputing p-values needs the paper’s full text.

Claims the paper makes

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Cites

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1 of the 21 references couldn’t be matched to a known paper.

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Authors
Al Bayaz, A., Giani, A., Foucaran, A., Pascal-Delannoy, F., & Boyer, A.
Affiliations
Centre National de la Recherche Scientifique (FR)
Corresponding author
Giani, A.
Venue
Thin Solid Films
Publisher
Elsevier BV
Published
2003-09
Volume
441
Issue
1-2
Pages
1-5
ISSN
0040-6090 (ISSN-L)
OpenAlex
W2048377614
Cited by
62
References
21
Citations by year
2025: 2 · 2024: 3 · 2023: 1 · 2022: 3 · 2021: 5 · 2019: 3 · 2018: 4 · 2017: 2 · 2016: 5 · 2015: 2 · 2014: 3 · 2013: 5 · 2012: 5
FWCI
0.85
Type
journal article
Language
en
Open access
closed
Locations
  • Thin Solid Films (publishedVersion)
  • HAL (submittedVersion)
Topics
  • Physical Sciences › Materials Science › Materials Chemistry › Advanced Thermoelectric Materials and Devices
  • Physical Sciences › Engineering › Electrical and Electronic Engineering › Chalcogenide Semiconductor Thin Films
  • Physical Sciences › Materials Science › Materials Chemistry › Phase-change materials and chalcogenides
Keywords
Bi2Se3, thin films, thermoelectric properties, Seebeck coefficient, carrier mobility, electrical resistivity, carrier concentration, n-type conductivity, trimethylbismuth, metalorganic chemical vapor deposition, growth parameter optimization

About these checks

Registry, retraction, Cites and statistics results are computed, not judged, with one exception: a printed reference that no index lists is read once by a model before it counts as a citation error. Claims are extracted by a model and kept only when their quote appears verbatim in the text; each cited source is then checked, with a model’s help, for whether it says what the claim relies on. Those verdicts can be wrong — read the claim’s quote and the cited source before relying on one.

Statistics and arithmetic are recomputed, not judged.

Confidence bands are shown only for fields calibrated on our annotated test set. None is calibrated yet, so no band is shown.

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