The DOI matches its Crossref record; 20 of the 20 references it cites were found in a registry or an index.
Modifying single-crystalline silicon by femtosecond laser pulses: an analysis by micro Raman spectroscopy, scanning laser microscopy and atomic force microscopy
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Citations
Cites
CRC Handbook of Chemistry and Physics
(2014) · doi:10.1201/b17118 · Cited by 57,706
Handbook of Optical Constants of Solids
(1985) · Elsevier eBooks · doi:10.1016/c2009-0-20920-2 · Cited by 20,926
Laser Processing and Chemistry
Bäuerle, D. (1996) · Springer eBooks · doi:10.1007/978-3-662-03253-4 · Cited by 2,196
Simple technique for measurements of pulsed Gaussian-beam spot sizes
Liu, J. M. (1982) · Optics Letters · doi:10.1364/ol.7.000196 · Cited by 1,887
CRC Handbook of Chemistry and Physics, 2009−2010, 90th ed.
(2009) · Journal of the American Chemical Society · doi:10.1021/ja906434c · Cited by 1,494
Laser Processing and Chemistry
Bäuerle, D. (2000) · Advanced Texts in Physics · doi:10.1007/978-3-662-04074-4 · Cited by 1,242
Micro-Raman spectroscopy to study local mechanical stress in silicon integrated circuits
Wolf, I. D. (1996) · Semiconductor Science and Technology · doi:10.1088/0268-1242/11/2/001 · Cited by 983
Pedrotti, F. L., Pedrotti, L. M., & Pedrotti, L. S. (2017) · Cambridge University Press eBooks · doi:10.1017/9781108552493 · Cited by 926
Femtosecond laser ablation of silicon–modification thresholds and morphology
Bonse, J., Baudach, S., Krüger, J., Kautek, W., & Lenzner, M. (2002) · Applied Physics A · doi:10.1007/s003390100893 · Cited by 824
Self-citationMicrostructuring of silicon with femtosecond laser pulses
Her, T.-H., Finlay, R. J., Wu, C., Deliwala, S., & Mazur, E. (1998) · Applied Physics Letters · doi:10.1063/1.122241 · Cited by 813
Cited by
Wavelength scaling of silicon laser ablation in picosecond regime
Sikora, A., Grojo, D., & Sentis, M. (2017) · Journal of Applied Physics · doi:10.1063/1.4994307 · Cited by 44
Metadata
- Authors
- Bonse, J., Brzezinka, K.-W., & Meixner, A. J.
- Venue
- Applied Surface Science
- Publisher
- Elsevier BV
- Published
- 2004-01
- Volume
- 221
- Issue
- 1-4
- Pages
- 215-230
- ISSN
- 0169-4332 (ISSN-L)
- OpenAlex
- W2073354581
- Cited by
- 254
- References
- 20
- FWCI
- 6.63
- Type
- journal article
- Language
- en
- Open access
- closed
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- CoChat. (2026). Citation check: Modifying single-crystalline silicon by femtosecond laser pulses: an analysis by micro Raman spectroscopy, scanning laser microscopy and atomic force microscopy. https://app.cochat.ai/papers/10.1016/s0169-4332(03)00881-x
- The paper
- Bonse, J., Brzezinka, K.-W., & Meixner, A. J. (2004). Modifying single-crystalline silicon by femtosecond laser pulses: an analysis by micro Raman spectroscopy, scanning laser microscopy and atomic force microscopy. Applied Surface Science. https://doi.org/10.1016/s0169-4332(03)00881-x
Data sources
Bibliographic data: Semantic Scholar, OpenAlex, Crossref.
Contains information from the Semantic Scholar Academic Graph Datasets, made available under the ODC Attribution License (ODC-BY 1.0).
Semantic Scholar’s data is described in: Kinney, R., et al. (2023). The Semantic Scholar Open Data Platform. arXiv:2301.10140.
