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Simple technique for measurements of pulsed Gaussian-beam spot sizes
Abstract
A simple technique for in situ measurements of pulsed Gaussian-beam spot sizes is reported. This technique is particularly useful for measurements on highly focused beam spots. It can also be used for absolute calibration of the threshold-energy fluences for pulsed-laser-induced effects. The thresholds for several effects in picosecondlaser-induced phase transformation on silicon-crystal surfaces are calibrated with this technique.
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Cited by
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Jaeggi, B., Neuenschwander, B., Schmid, M., Muralt, M., Zuercher, J., & Hunziker, U. (2011) · Physics Procedia · doi:10.1016/j.phpro.2011.03.118 · Cited by 133
Dittrich, S., Barcikowski, S., & Gökce, B. (2021) · Opto-Electronic Advances · doi:10.29026/oea.2021.200072 · Cited by 69
Wavelength scaling of silicon laser ablation in picosecond regime
Sikora, A., Grojo, D., & Sentis, M. (2017) · Journal of Applied Physics · doi:10.1063/1.4994307 · Cited by 44
Kudryashov, S. I., Nastulyavichus, A. A., Ivanova, A. K., Smirnov, N. A., Khmelnitskiy, R. A., Rudenko, A. A., Saraeva, I. N., Tolordava, E. R., Yu. Kharin, A., Zavestovskaya, I. N., et al. (2019) · Applied Surface Science · doi:10.1016/j.apsusc.2018.11.201 · Cited by 26
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Metadata
- Authors
- Liu, J. M.
- Venue
- Optics Letters
- Publisher
- Optica Publishing Group
- Published
- 1982-05-01
- Volume
- 7
- Issue
- 5
- Pages
- 196
- ISSN
- 0146-9592 (ISSN-L)
- 1539-4794
- OpenAlex
- W2114665955
- Cited by
- 1,887
- References
- 0
- FWCI
- 4.26
- Type
- journal article
- Language
- en
- Open access
- closed
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- Liu, J. M. (1982). Simple technique for measurements of pulsed Gaussian-beam spot sizes. Optics Letters. https://doi.org/10.1364/ol.7.000196
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