Cited by 152Electron and X-Ray Spectroscopy TechniquesMagnetic properties of thin filmsSurface and Thin Film Phenomena

Spin-polarized Fermi surface mapping

Hoesch, M., Greber, T., Petrov, V.N., Muntwiler, M., Hengsberger, M., Auwärter, W., Osterwalder, J.·2002·Journal of Electron Spectroscopy and Related Phenomena

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Crossref · 10.1016/s0368-2048(02)00058-0

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41 of 41 references verified0 citation errors · 0 not checkable

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  • Spin-resolved ARPES systematically measures all three components of the electron spin as a function of energy and momentum.

    “SR ARPES measurements were performed on the SIS beamline at the Swiss Light Source using the COPHEE spectrometer with two 40 kV classical Mott detectors and a photon energy of 24 eV, which systematically measures all three components of the spin of the electron (P x , P y and P z ) as a function of its energy and momentum 25,26 .”

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Authors
Hoesch, M., Greber, T., Petrov, V. N., Muntwiler, M., Hengsberger, M., Auwärter, W., & Osterwalder, J.
Affiliations
  • University of Zurich (CH)
  • Peter the Great St. Petersburg Polytechnic University (RU)
Corresponding author
Hoesch, M.
Venue
Journal of Electron Spectroscopy and Related Phenomena
Publisher
Elsevier BV
Published
2002-07
Volume
124
Issue
2-3
Pages
263-279
ISSN
0368-2048 (ISSN-L)
OpenAlex
W2139259529
Cited by
151
References
39
Citations by year
2026: 4 · 2025: 2 · 2024: 6 · 2023: 4 · 2022: 4 · 2021: 4 · 2020: 7 · 2019: 1 · 2018: 13 · 2017: 9 · 2016: 9 · 2015: 7 · 2014: 12 · 2013: 13 · 2012: 10
FWCI
1.68
Type
journal article
Language
en
Open access
closed
Locations
  • Journal of Electron Spectroscopy and Related Phenomena (publishedVersion)
  • DORA PSI (Paul Scherrer Institute) (submittedVersion)
Topics
  • Physical Sciences › Materials Science › Surfaces, Coatings and Films › Electron and X-Ray Spectroscopy Techniques
  • Physical Sciences › Physics and Astronomy › Atomic and Molecular Physics, and Optics › Magnetic properties of thin films
  • Physical Sciences › Physics and Astronomy › Atomic and Molecular Physics, and Optics › Surface and Thin Film Phenomena
Keywords
itinerant ferromagnets, angle-resolved photoemission, spin polarization, polarimeter, Ni(111), magnetic thin films, multilayer systems, electronic band structure, magnetization direction

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