Preparation and Evaluation of LaNiO3 Thin Film Electrode with Chemical Solution Deposition
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Some authors have demonstrated a columnar grain structure of LNO films using PLD and CSD techniques.
“Some authors have demonstrated a columnar grain structure of LNO films using PLD [29] and CSD [15,22,40] techniques.”
From Control of Columnar Grain Microstructure in CSD LaNiO3 Films (2023) · cites this paper as [40]
Columnar grain growth in CSD films is usually caused by heterogeneous nucleation at the film-substrate interface.
“Columnar grain growth in CSD films is usually caused by heterogeneous nucleation at the film–substrate interface [34,35,36,37,38,39,40,41,42,43,44,45].”
From Control of Columnar Grain Microstructure in CSD LaNiO3 Films (2023) · cites this paper as [40]
Cited by
Sorted by citations
Duan, Z., Cui, Y., Yang, Z., Li, K., Wan, Y., Lu, Z., Xie, Y., & Zhang, J. (2018) · Ceramics International · doi:10.1016/j.ceramint.2017.09.230 · Cited by 32 · see citing works
Control of Columnar Grain Microstructure in CSD LaNiO3 Films
Atanova, A. V., Seregin, D. S., Zhigalina, O. M., Khmelenin, D. N., Orlov, G. A., Turkina, D. I., Sigov, A. S., & Vorotilov, K. A. (2023) · Molecules · doi:10.3390/molecules28041938 · Cited by 5 · see citing works
Ashihara, R., Kawahara, M., Okazaki, H., Yamamoto, S., & Kawae, T. (2024) · Journal of the Ceramic Society of Japan · doi:10.2109/jcersj2.24021 · Cited by 3 · see citing works
- Authors
- Miyazaki, H., Goto, T., Miwa, Y., Ohno, T., Suzuki, H., Ota, T., & Takahashi, M.
- Affiliations
- Tohoku University (JP)
- Shizuoka University (JP)
- Nagoya Institute of Technology (JP)
- Corresponding author
- Miyazaki, Hidetoshi
- Venue
- Journal of the European Ceramic Society
- Publisher
- Elsevier BV
- Published
- 2004-01
- Volume
- 24
- Issue
- 6
- Pages
- 1005-1008
- ISSN
- 0955-2219 (ISSN-L)
- OpenAlex
- W2017151590
- Cited by
- 76
- References
- 0
- Citations by year
- 2025: 1 · 2024: 2 · 2023: 1 · 2022: 2 · 2021: 2 · 2020: 4 · 2019: 1 · 2018: 5 · 2017: 4 · 2016: 4 · 2015: 6 · 2014: 3 · 2013: 4 · 2012: 7
- FWCI
- 2.12
- Type
- journal article
- Language
- en
- Open access
- closed
- Locations
- Journal of the European Ceramic Society (publishedVersion)
- Topics
- Physical Sciences › Materials Science › Materials Chemistry › Ferroelectric and Piezoelectric Materials
- Physical Sciences › Materials Science › Electronic, Optical and Magnetic Materials › Multiferroics and related materials
- Physical Sciences › Materials Science › Materials Chemistry › Electronic and Structural Properties of Oxides
- Keywords
- LaNiO3 thin films, chemical solution deposition, (100) orientation, precursor concentration, electrical resistivity, lead zirconate titanate, ferroelectricity, electrode fabrication, silicon substrate
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Registry, retraction, Cites and statistics results are computed, not judged, with one exception: a printed reference that no index lists is read once by a model before it counts as a citation error. Claims are extracted by a model and kept only when their quote appears verbatim in the text; each cited source is then checked, with a model’s help, for whether it says what the claim relies on. Those verdicts can be wrong — read the claim’s quote and the cited source before relying on one.
Statistics and arithmetic are recomputed, not judged.
Confidence bands are shown only for fields calibrated on our annotated test set. None is calibrated yet, so no band is shown.
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