The DOI matches its Crossref record; 11 of the 11 references it cites were found in a registry or an index.
Interfaces and stresses in thin films
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Citations
Cites
Mechanical properties of thin films
Nix, W. D. (1989) · Metallurgical Transactions A · doi:10.1007/bf02666659 · Cited by 2,546
Shuttleworth, R. (1950) · Proceedings of the Physical Society. Section A · doi:10.1088/0370-1298/63/5/302 · Cited by 1,115
Surface and interface stress effects in thin films
Cammarata, R. C. (1994) · Progress in Surface Science · doi:10.1016/0079-6816(94)90005-1 · Cited by 950
Stresses and deformation processes in thin films on substrates
Doerner, M. F., & Nix, W. D. (1988) · Critical Reviews in Solid State and Materials Sciences · doi:10.1080/10408438808243734 · Cited by 617
Surface Stress in the Self-Assembly of Alkanethiols on Gold
Berger, R., Delamarche, E., Lang, H. P., Gerber, C., Gimzewski, J. K., Meyer, E., & Güntherodt, H.-J. (1997) · Science · doi:10.1126/science.276.5321.2021 · Cited by 544
Stresses in thin films: The relevance of grain boundaries and impurities
Hoffman, R. W. (1976) · Thin Solid Films · doi:10.1016/0040-6090(76)90453-3 · Cited by 479
On surface stress and surface tension
Mays, C. W., Vermaak, J. S., & Kuhlmann-Wilsdorf, D. (1968) · Surface Science · doi:10.1016/0039-6028(68)90119-2 · Cited by 377
Townsend, P. H., Barnett, D. M., & Brunner, T. A. (1987) · Journal of Applied Physics · doi:10.1063/1.339082 · Cited by 374
Grain Growth and Stress Relief in Thin Films
Chaudhari, P. (1972) · Journal of Vacuum Science and Technology · doi:10.1116/1.1316674 · Cited by 317
Measurements of stress during vapor deposition of copper and silver thin films and multilayers
Shull, A. L., & Spaepen, F. (1996) · Journal of Applied Physics · doi:10.1063/1.363701 · Cited by 233
Self-citation
Cited by
Wearable sensors: modalities, challenges, and prospects
Heikenfeld, J., Jajack, A., Rogers, J., Gutruf, P., Tian, L., Pan, T., Li, R., Khine, M., Kim, J., Wang, J., et al. (2018) · Lab on a Chip · doi:10.1039/c7lc00914c · Cited by 1,434
Wang, X., Zeng, W., Hong, L., Xu, W., Yang, H., Wang, F., Duan, H., Tang, M., & Jiang, H. (2018) · Nature Energy · doi:10.1038/s41560-018-0104-5 · Cited by 499
Indentation across size scales and disciplines: Recent developments in experimentation and modeling
GOULDSTONE, A., CHOLLACOOP, N., DAO, M., LI, J., MINOR, A., & SHEN, Y. (2007) · Acta Materialia · doi:10.1016/j.actamat.2006.08.044 · Cited by 473
Kinetic Model for Dependence of Thin Film Stress on Growth Rate, Temperature, and Microstructure
Chason, E., Shin, J. W., Hearne, S. J., & Freund, L. B. (2012) · Journal of Applied Physics · doi:10.1063/1.4704683 · Cited by 134
A Kinetic Model for Stress Generation in Thin Films Grown from Energetic Vapor Fluxes
Chason, E., Karlson, M., Colin, J. J., Magnfält, D., Sarakinos, K., & Abadias, G. (2016) · Journal of Applied Physics · doi:10.1063/1.4946039 · Cited by 90
Metadata
- Authors
- Spaepen, F.
- Venue
- Acta Materialia
- Publisher
- Elsevier BV
- Published
- 2000-01
- Volume
- 48
- Issue
- 1
- Pages
- 31-42
- ISSN
- 1359-6454 (ISSN-L)
- OpenAlex
- W1993838312
- Cited by
- 531
- References
- 11
- FWCI
- 31.67
- Type
- journal article
- Language
- en
- Open access
- closed
About these checks
Registry, retraction, Cites and statistics results are computed, not judged, with one exception: a printed reference that no index lists is read once by a model before it counts as a citation error. Claims are extracted by a model and kept only when their quote appears verbatim in the text; each cited source is then checked, with a model’s help, for whether it says what the claim relies on. Those verdicts can be wrong — read the claim’s quote and the cited source before relying on one.
Statistics and arithmetic are recomputed, not judged.
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- CoChat. (2026). Citation check: Interfaces and stresses in thin films. https://app.cochat.ai/papers/10.1016/s1359-6454(99)00286-4
- The paper
- Spaepen, F. (2000). Interfaces and stresses in thin films. Acta Materialia. https://doi.org/10.1016/s1359-6454(99)00286-4
Data sources
Bibliographic data: Semantic Scholar, OpenAlex, Crossref.
Contains information from the Semantic Scholar Academic Graph Datasets, made available under the ODC Attribution License (ODC-BY 1.0).
Semantic Scholar’s data is described in: Kinney, R., et al. (2023). The Semantic Scholar Open Data Platform. arXiv:2301.10140.
