Cited by 4Fusion materials and technologiesNuclear materials and radiation effectsIon-surface interactions and analysis

In Situ Probing of the Evolution of Irradiation-induced Defects in Copper

Li, N., Hattar, K., Misra, A.·2015·Microscopy and Microanalysis

Abstract

N Li, K Hattar, A Misra; In Situ Probing of the Evolution of Irradiation-induced Defects in Copper, Microscopy and Microanalysis, Volume 21, Issue S3, 1 Au

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Crossref · 10.1017/s1431927615003013

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  • The observed decrease in thermal diffusivity is possibly caused by stacking fault tetrahedra (SFT) defects, as suggested by previous room temperature, low dose irradiations.

    “The observed decrease in thermal diffusivity is possibly caused by stacking fault tetrahedra (SFT) defects, as suggested by previous room temperature, low dose irradiations [38, 39].”

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Authors
Li, N., Hattar, K., & Misra, A.
Affiliations
  • Los Alamos National Laboratory (US)
  • Sandia National Laboratories (US)
  • University of Michigan (US)
Venue
Microscopy and Microanalysis
Published
2015-08
Volume
21
Issue
S3
Pages
443-444
ISSN
  • 1431-9276 (ISSN-L)
  • 1435-8115
OpenAlex
W2560683645
Cited by
4
References
0
Citations by year
2026: 1 · 2025: 1 · 2022: 2
FWCI
0.00
Type
journal article
Language
en
Open access
closed
Locations
Microscopy and Microanalysis (publishedVersion)
Topics
  • Physical Sciences › Materials Science › Materials Chemistry › Fusion materials and technologies
  • Physical Sciences › Materials Science › Materials Chemistry › Nuclear materials and radiation effects
  • Physical Sciences › Engineering › Computational Mechanics › Ion-surface interactions and analysis
Keywords
copper, radiation-induced defects, defect evolution, in situ probing, radiation damage, radiation effects

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