The DOI matches its Crossref record; 262 of the 262 references it cites were found in a registry or an index.
High-k Gate Dielectrics for Emerging Flexible and Stretchable Electronics
Open accessAbstract
Recent advances in flexible and stretchable electronics (FSE), a technology diverging from the conventional rigid silicon technology, have stimulated fundamental scientific and technological research efforts. FSE aims at enabling disruptive applications such as flexible displays, wearable sensors, printed RFID tags on packaging, electronics on skin/organs, and Internet-of-things as well as possibly reducing the cost of electronic device fabrication. Thus, the key materials components of electronics, the semiconductor, the dielectric, and the conductor as well as the passive (substrate, planarization, passivation, and encapsulation layers) must exhibit electrical performance and mechanical properties compatible with FSE components and products. In this review, we summarize and analyze recent advances in materials concepts as well as in thin-film fabrication techniques for high- k (or high-capacitance) gate dielectrics when integrated with FSE-compatible semiconductors such as organics, metal oxides, quantum dot arrays, carbon nanotubes, graphene, and other 2D semiconductors. Since thin-film transistors (TFTs) are the key enablers of FSE devices, we discuss TFT structures and operation mechanisms after a discussion on the needs and general requirements of gate dielectrics. Also, the advantages of high- k dielectrics over low- k ones in TFT applications were elaborated. Next, after presenting the design and properties of high- k polymers and inorganic, electrolyte, and hybrid dielectric families, we focus on the most important fabrication methodologies for their deposition as TFT gate dielectric thin films. Furthermore, we provide a detailed summary of recent progress in performance of FSE TFTs based on these high- k dielectrics, focusing primarily on emerging semiconductor types. Finally, we conclude with an outlook and challenges section.
Overview
The claims and statistics of this paper haven’t been checked yet.
Run the check — free, no account needed. It reads the open-access text and checks the sources it cites.
Integrity signals
Registry
Cites
Statistics
Verification
Claims the paper makes
The claims and statistics of this paper haven’t been checked yet.
Run the check — free, no account needed. It reads the open-access text and checks the sources it cites.
Self-check
Percentages, sums and reported differences re-computed from the paper’s own numbers.
The self-check needs the paper’s full text.
Citations
Cites
Electric Field Effect in Atomically Thin Carbon Films
Novoselov, K. S., Geim, A. K., Morozov, S. V., Jiang, D., Zhang, Y., Dubonos, S. V., Grigorieva, I. V., & Firsov, A. A. (2004) · Science · doi:10.1126/science.1102896 · Cited by 66,834
Helical microtubules of graphitic carbon
Iijima, S. (1991) · Nature · doi:10.1038/354056a0 · Cited by 43,098
Atomically Thin MoS 2 : A New Direct-Gap Semiconductor
Mak, K. F., Lee, C., Hone, J., Shan, J., & Heinz, T. F. (2010) · Physical Review Letters · doi:10.1103/physrevlett.105.136805 · Cited by 15,586
Radisavljevic, B., Radenovic, A., Brivio, J., Giacometti, V., & Kis, A. (2011) · Nature Nanotechnology · doi:10.1038/nnano.2010.279 · Cited by 14,939
Two-dimensional atomic crystals
Novoselov, K. S., Jiang, D., Schedin, F., Booth, T. J., Khotkevich, V. V., Morozov, S. V., & Geim, A. K. (2005) · Proceedings of the National Academy of Sciences · doi:10.1073/pnas.0502848102 · Cited by 11,788
Black phosphorus field-effect transistors
Li, L., Yu, Y., Ye, G. J., Ge, Q., Ou, X., Wu, H., Feng, D., Chen, X. H., & Zhang, Y. (2014) · Nature Nanotechnology · doi:10.1038/nnano.2014.35 · Cited by 8,413
Nomura, K., Ohta, H., Takagi, A., Kamiya, T., Hirano, M., & Hosono, H. (2004) · Nature · doi:10.1038/nature03090 · Cited by 7,504
Phosphorene: An Unexplored 2D Semiconductor with a High Hole Mobility
Liu, H., Neal, A. T., Zhu, Z., Luo, Z., Xu, X., Tománek, D., & Ye, P. D. (2014) · ACS Nano · doi:10.1021/nn501226z · Cited by 6,480
Atomic Layer Deposition: An Overview
George, S. M. (2010) · Chemical Reviews · doi:10.1021/cr900056b · Cited by 5,814
Room-temperature transistor based on a single carbon nanotube
Tans, S. J., Verschueren, A. R. M., & Dekker, C. (1998) · Nature · doi:10.1038/29954 · Cited by 5,425
Cited by
Neuromorphic sensorimotor loop embodied by monolithically integrated, low-voltage, soft e-skin
Wang, W., Jiang, Y., Zhong, D., Zhang, Z., Choudhury, S., Lai, J.-C., Gong, H., Niu, S., Yan, X., Zheng, Y., et al. (2023) · Science · doi:10.1126/science.ade0086 · Cited by 788
Liu, K., Ouyang, B., Guo, X., Guo, Y., & Liu, Y. (2022) · npj Flexible Electronics · doi:10.1038/s41528-022-00133-3 · Cited by 554
2D Materials in Flexible Electronics: Recent Advances and Future Prospectives
Katiyar, A. K., Hoang, A. T., Xu, D., Hong, J., Kim, B. J., Ji, S., & Ahn, J.-H. (2024) · Chemical Reviews · doi:10.1021/acs.chemrev.3c00302 · Cited by 363
Stretchable transistors and functional circuits for human-integrated electronics
Dai, Y., Hu, H., Wang, M., Xu, J., & Wang, S. (2021) · Nature Electronics · doi:10.1038/s41928-020-00513-5 · Cited by 315
Designing wearable microgrids: towards autonomous sustainable on-body energy management
Yin, L., Kim, K. N., Trifonov, A., Podhajny, T., & Wang, J. (2022) · Energy & Environmental Science · doi:10.1039/d1ee03113a · Cited by 111
Metadata
- Authors
- Wang, B., Huang, W., Chi, L., Al-Hashimi, M., Marks, T. J., & Facchetti, A.
- Venue
- Chemical Reviews
- Publisher
- American Chemical Society (ACS)
- Published
- 2018-05-22
- Volume
- 118
- Issue
- 11
- Pages
- 5690-5754
- ISSN
- 0009-2665 (ISSN-L)
- 1520-6890
- OpenAlex
- W2803983715
- Cited by
- 818
- References
- 262
- FWCI
- 5.45
- Type
- journal article
- Language
- en
- Open access
- hybrid
About these checks
Registry, retraction, Cites and statistics results are computed, not judged, with one exception: a printed reference that no index lists is read once by a model before it counts as a citation error. Claims are extracted by a model and kept only when their quote appears verbatim in the text; each cited source is then checked, with a model’s help, for whether it says what the claim relies on. Those verdicts can be wrong — read the claim’s quote and the cited source before relying on one.
Statistics and arithmetic are recomputed, not judged.
Confidence bands are shown only for fields calibrated on our annotated test set. None is calibrated yet, so no band is shown.
What counts as a claim ›How we measure confidence ›How we check this ›
Are you an author, or do you see a problem with this page? Request a review
How to cite
Cite CoChat for the checks on this page, and the paper for its own findings.
- This page
- CoChat. (2026). Citation check: High-k Gate Dielectrics for Emerging Flexible and Stretchable Electronics. https://app.cochat.ai/papers/10.1021/acs.chemrev.8b00045
- The paper
- Wang, B., Huang, W., Chi, L., Al-Hashimi, M., Marks, T. J., & Facchetti, A. (2018). High-k Gate Dielectrics for Emerging Flexible and Stretchable Electronics. Chemical Reviews. https://doi.org/10.1021/acs.chemrev.8b00045
Data sources
Bibliographic data: Semantic Scholar, OpenAlex, Crossref.
Contains information from the Semantic Scholar Academic Graph Datasets, made available under the ODC Attribution License (ODC-BY 1.0).
Semantic Scholar’s data is described in: Kinney, R., et al. (2023). The Semantic Scholar Open Data Platform. arXiv:2301.10140.