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Ion Gel-Gated Polymer Thin-Film Transistors: Operating Mechanism and Characterization of Gate Dielectric Capacitance, Switching Speed, and Stability
Abstract
We report comprehensive characterization of electrolyte-gated polymer thin-film transistors (TFTs) incorporating solution processable polymer semiconductors and high capacitance “ion gel” gate dielectrics. The ion gel dielectrics comprise self-assembled networks of triblock copolymers such as poly(styrene- b -methylmethacrylate- b -styrene) [PS-PMMA-PS] that are swollen with ionic liquids, e.g., (1-ethyl-3-methylimidazolium bis(trifluoromethylsulfonyl)imide ([EMIM][TFSI]). The capacitance of the gels is exceptionally large (>10 μF/cm 2 at 10 Hz), which is derived from the high concentration of mobile ions and facilitates operation of ion gel-gated organic TFTs (GEL-OTFTs) at very low voltages (< 2.5 V). Gate-induced hole densities in GEL-OTFTs employing different polythiophene semiconductors in the channel are on the order of 10 14 carriers/cm 2, with associated saturation hole mobilities that are also remarkably large, ∼1 cm 2 /(V s), likely because of the large gate-induced carrier densities. Examination of the frequency response of GEL-OTFTs indicates that increases in the OFF current with frequency ultimately limit switching speed; the cutoff frequency correlates with the ionic conductivity versus frequency response of the gel dielectric. Further, attenuated total internal reflection infrared (ATR-IR) spectroscopy of the ion gel/polymer semiconductor gate stack reveals that the conductance switching mechanism in GEL-OTFTs spans both electrochemical and electrostatic (field effect) regimes. Specifically, modeling of the time dependence of the near-infrared polaron absorption in gated GEL-OTFTs indicates that the [TFSI] − anion diffusivity in regioregular poly(3-hexylthiophene) is on the order of 10 −12 cm 2 /s at room temperature. This diffusivity implies that, for time scales greater than 1 ms, there is significant penetration (>1 nm) of [TFSI] − anion into the polymer semiconductor at the gel/polymer semiconductor interface, corresponding to an electrochemical doping process. On the other hand, for time scales shorter than 1 ms (i.e., for GEL-OTFT switching frequencies >1 kHz), the device switching mechanism can be viewed as primarily electrostatic as average ion penetration depths are less than 1 nm.
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Metadata
- Authors
- Lee, J., Kaake, L. G., Cho, J. H., Zhu, X.-Y., Lodge, T. P., & Frisbie, C. D.
- Venue
- The Journal of Physical Chemistry C
- Publisher
- American Chemical Society (ACS)
- Published
- 2009-05-21
- Volume
- 113
- Issue
- 20
- Pages
- 8972-8981
- ISSN
- 1932-7447 (ISSN-L)
- 1932-7455
- OpenAlex
- W2091967238
- Cited by
- 385
- References
- 0
- FWCI
- 14.78
- Type
- journal article
- Language
- en
- Open access
- closed
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- Lee, J., Kaake, L. G., Cho, J. H., Zhu, X.-Y., Lodge, T. P., & Frisbie, C. D. (2009). Ion Gel-Gated Polymer Thin-Film Transistors: Operating Mechanism and Characterization of Gate Dielectric Capacitance, Switching Speed, and Stability. The Journal of Physical Chemistry C. https://doi.org/10.1021/jp901426e
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