The DOI matches its Crossref record; 11 of the 11 references it cites were found in a registry or an index.
Charge Recombination Kinetics in Dye-Sensitized Nanocrystalline Titanium Dioxide Films under Externally Applied Bias
Abstract
The kinetics of charge recombination were determined following low intensity optical excitation of Ru II (2,2‘-bipyridyl-4,4‘dicarboxylate) 2 (NCS) 2 sensitized nanocrystalline TiO 2 films as a function of externally applied bias voltage V . These kinetics were found to be multiexponential. The median time ( t 50% ) for charge recombination was found to depend strongly upon bias voltage, reducing from t 50% ∼ 200 ms for V = 0 V versus Ag/AgCl to < 30 ns for V ≤ −500 mV. This reduction in t 50% was found to follow the equation t 50% ∝ exp( qV /1.7 k B T ). These results are consistent with the charge recombination kinetics being strongly dependent upon the accumulation of electrons in intraband/conduction band states of the TiO 2 film. For biases V ≤ −400 mV, the rate of charge recombination was found to exceed the rate of rereduction of the dye cation by an I - /I 3 - redox couple in solution.
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Metadata
- Authors
- Haque, S. A., Tachibana, Y., Klug, D. R., & Durrant, J. R.
- Venue
- The Journal of Physical Chemistry B
- Publisher
- American Chemical Society (ACS)
- Published
- 1998-02-18
- Volume
- 102
- Issue
- 10
- Pages
- 1745-1749
- ISSN
- 1520-5207 (ISSN-L)
- 1520-6106
- OpenAlex
- W1994213559
- Cited by
- 340
- References
- 11
- FWCI
- 25.32
- Type
- journal article
- Language
- en
- Open access
- closed
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