Investigation of Humidity-Dependent Capillary Force

Abstract

Due to the strong capillary condensation, the adhesion force between a Si 3 N 4 atomic force microscope (AFM) tip and silicon oxide was observed to first increase and then decrease with an increase of humidity. In contrast, due to weak capillary condensation, the adhesion force between the AFM tip and the N -octadecyltrimethoxysilane (OTE, CH 3 (CH 2 ) 17 Si(OCH 2 CH 3 ) 3 ) self-assembled monolayer (SAM) was found to be almost independent of humidity. It was found that the formulation commonly used for macroscopic objects fails to explain our data. Using an accurate formulation and an assumed tip shape, we can explain the observed decrease of adhesion for SiO 2 at high humidity as being due to the decreased capillary pressure force when the dimension of the meniscus becomes comparable with the tip size. However, the observed late onset of adhesion of SiO 2 cannot be understood within the framework of the classical continuum theory. We attribute this late onset to the properties of an ultrathin water film at molecular thickness. The new formulation predicts a vanishing water meniscus between the AFM tip and OTE over the entire humidity range and can also fully account for the humidity-independent adhesion results for OTE.