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Cited by 305

The DOI matches its Crossref record; 21 of the 21 references it cites were found in a registry or an index.

Capillary forces in tapping mode atomic force microscopy

Open access
Zitzler, L., Herminghaus, S., Mugele, F.·2002·Physical Review B

Abstract

We investigated the influence of the relative humidity on amplitude and phase of the cantilever oscillation while operating an atomic force microscope (AFM) in the tapping mode. If the free oscillation amplitude ${A}_{0}$ exceeds a certain critical amplitude ${A}_{c},$ the amplitude- and phase-distance curves show a transition from a regime with a net attractive force between tip and sample to a net repulsive regime. For hydrophilic tip and sample this critical amplitude ${A}_{c}$ is found to increase with increasing relative humidity. In contrast, no such dependence was found for hydrophobic samples. Numerical simulations show that this behavior can be explained by assuming the intermittent formation and rupture of a capillary neck in each oscillation cycle of the AFM cantilever.

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Metadata

Authors
Zitzler, L., Herminghaus, S., & Mugele, F.
Venue
Physical Review B
Published
2002-10-31
Volume
66
Issue
15
ISSN
  • 0163-1829 (ISSN-L)
  • 1095-3795
OpenAlex
W2049592940
Cited by
305
References
21
FWCI
5.60
Type
journal article
Language
en
Open access
bronze

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CoChat. (2026). Citation check: Capillary forces in tapping mode atomic force microscopy. https://app.cochat.ai/papers/10.1103/physrevb.66.155436
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Zitzler, L., Herminghaus, S., & Mugele, F. (2002). Capillary forces in tapping mode atomic force microscopy. Physical Review B. https://doi.org/10.1103/physrevb.66.155436

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