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On the Factors Affecting the Contrast of Height and Phase Images in Tapping Mode Atomic Force Microscopy
Abstract
Tapping mode atomic force microscopy measurements were performed for patterned self-assembled monolayers (SAMs) of −S(CH 2 ) 15 CH 3 and −S(CH 2 ) 15 COOH groups on a polycrystalline Au substrate. Height and phase images of these SAMs were obtained as a function of the driving amplitude A 0 and the set-point amplitude A sp . Factors influencing the contrasts of these images are discussed in terms of the simple approximation that the essential consequence of bringing the tip closer to the sample surface is to change the force constant of the cantilever.
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Cited by
Tong, J. D., Leclère, P., Doneux, C., Brédas, J. L., Lazzaroni, R., & Jérôme, R. (2001) · Polymer · doi:10.1016/s0032-3861(00)00759-x · Cited by 49
An in-situ hot stage for temperature-dependent tapping-mode™ atomic force microscopy
Prilliman, S. G., Kavanagh, A. M., Scher, E. C., Robertson, S. T., Hwang, K. S., & Colvin, V. L. (1998) · Review of Scientific Instruments · doi:10.1063/1.1149090 · Cited by 19
Metadata
- Authors
- Brandsch, R., Bar, G., & Whangbo, M.-H.
- Venue
- Langmuir
- Publisher
- American Chemical Society (ACS)
- Published
- 1997-11-01
- Volume
- 13
- Issue
- 24
- Pages
- 6349-6353
- ISSN
- 0743-7463 (ISSN-L)
- 1520-5827
- OpenAlex
- W1973058927
- Cited by
- 161
- References
- 0
- FWCI
- 10.78
- Type
- journal article
- Language
- en
- Open access
- closed
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- CoChat. (2026). Citation check: On the Factors Affecting the Contrast of Height and Phase Images in Tapping Mode Atomic Force Microscopy. https://app.cochat.ai/papers/10.1021/la970822i
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- Brandsch, R., Bar, G., & Whangbo, M.-H. (1997). On the Factors Affecting the Contrast of Height and Phase Images in Tapping Mode Atomic Force Microscopy. Langmuir. https://doi.org/10.1021/la970822i
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