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Quantifying Defects in Graphene via Raman Spectroscopy at Different Excitation Energies
Open accessAbstract
We present a Raman study of Ar(+)-bombarded graphene samples with increasing ion doses. This allows us to have a controlled, increasing, amount of defects. We find that the ratio between the D and G peak intensities, for a given defect density, strongly depends on the laser excitation energy. We quantify this effect and present a simple equation for the determination of the point defect density in graphene via Raman spectroscopy for any visible excitation energy. We note that, for all excitations, the D to G intensity ratio reaches a maximum for an interdefect distance ∼3 nm. Thus, a given ratio could correspond to two different defect densities, above or below the maximum. The analysis of the G peak width and its dispersion with excitation energy solves this ambiguity.
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Citations
Cited by
Raman spectroscopy as a versatile tool for studying the properties of graphene
Ferrari, A. C., & Basko, D. M. (2013) · Nature Nanotechnology · doi:10.1038/nnano.2013.46 · Cited by 7,405
Self-citationRaman study of D* band in graphene oxide and its correlation with reduction
Lee, A. Y., Yang, K., Anh, N. D., Park, C., Lee, S. M., Lee, T. G., & Jeong, M. S. (2021) · Applied Surface Science · doi:10.1016/j.apsusc.2020.147990 · Cited by 659
Qu, K., Zheng, Y., Zhang, X., Davey, K., Dai, S., & Qiao, S. Z. (2017) · ACS Nano · doi:10.1021/acsnano.7b03290 · Cited by 426
Min, P., Liu, J., Li, X., An, F., Liu, P., Shen, Y., Koratkar, N., & Yu, Z. (2018) · Advanced Functional Materials · doi:10.1002/adfm.201805365 · Cited by 375
Self-Activated Transparent All-Graphene Gas Sensor with Endurance to Humidity and Mechanical Bending
Kim, Y. H., Kim, S. J., Kim, Y.-J., Shim, Y.-S., Kim, S. Y., Hong, B. H., & Jang, H. W. (2015) · ACS Nano · doi:10.1021/acsnano.5b04680 · Cited by 332
Metadata
- Authors
- Cançado, L. G., Jorio, A., Ferreira, E. H. M., Stavale, F., Achete, C. A., Capaz, R. B., Moutinho, M. V. O., Lombardo, A., Kulmala, T. S., & Ferrari, A. C.
- Venue
- Nano Letters
- Publisher
- American Chemical Society (ACS)
- Published
- 2011-07-05
- Volume
- 11
- Issue
- 8
- Pages
- 3190-3196
- ISSN
- 1530-6984 (ISSN-L)
- 1530-6992
- OpenAlex
- W2024261075
- Cited by
- 3,694
- References
- 0
- FWCI
- 57.01
- Type
- journal article
- Language
- en
- Open access
- green
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- Cançado, L. G., Jorio, A., Ferreira, E. H. M., Stavale, F., Achete, C. A., Capaz, R. B., Moutinho, M. V. O., Lombardo, A., Kulmala, T. S., & Ferrari, A. C. (2011). Quantifying Defects in Graphene via Raman Spectroscopy at Different Excitation Energies. Nano Letters. https://doi.org/10.1021/nl201432g
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