The DOI matches its Crossref record; 42 of the 42 references it cites were found in a registry or an index.
Enhancement of the Electrical Properties of Graphene Grown by Chemical Vapor Deposition via Controlling the Effects of Polymer Residue
Abstract
Residual polymer (here, poly(methyl methacrylate), PMMA) left on graphene from transfer from metals or device fabrication processes affects its electrical and thermal properties. We have found that the amount of polymer residue left after the transfer of chemical vapor deposited (CVD) graphene varies depending on the initial concentration of the polymer solution, and this residue influences the electrical performance of graphene field-effect transistors fabricated on SiO2/Si. A PMMA solution with lower concentration gave less residue after exposure to acetone, resulting in less p-type doping in graphene and higher charge carrier mobility. The electrical properties of the weakly p-doped graphene could be further enhanced by exposure to formamide with the Dirac point at nearly zero gate voltage and a more than 50% increase of the room-temperature charge carrier mobility in air. This can be attributed to electron donation to graphene by the -NH2 functional group in formamide that is absorbed in the polymer residue. This work provides a route to enhancing the electrical properties of CVD-grown graphene even when it has a thin polymer coating.
Overview
The claims and statistics of this paper haven’t been checked yet.
Run the check — free, no account needed. It reads the open-access text and checks the sources it cites.
Integrity signals
Registry
Cites
Statistics
Verification
Claims the paper makes
The claims and statistics of this paper haven’t been checked yet.
Run the check — free, no account needed. It reads the open-access text and checks the sources it cites.
Self-check
Percentages, sums and reported differences re-computed from the paper’s own numbers.
The self-check needs the paper’s full text.
Citations
Cites
Electric Field Effect in Atomically Thin Carbon Films
Novoselov, K. S., Geim, A. K., Morozov, S. V., Jiang, D., Zhang, Y., Dubonos, S. V., Grigorieva, I. V., & Firsov, A. A. (2004) · Science · doi:10.1126/science.1102896 · Cited by 66,834
Experimental observation of the quantum Hall effect and Berry's phase in graphene
Zhang, Y., Tan, Y.-W., Stormer, H. L., & Kim, P. (2005) · Nature · doi:10.1038/nature04235 · Cited by 13,435
Large-Area Synthesis of High-Quality and Uniform Graphene Films on Copper Foils
Li, X., Cai, W., An, J., Kim, S., Nah, J., Yang, D., Piner, R., Velamakanni, A., Jung, I., Tutuc, E., et al. (2009) · Science · doi:10.1126/science.1171245 · Cited by 11,220
Self-citationGraphene and Graphene Oxide: Synthesis, Properties, and Applications
Zhu, Y., Murali, S., Cai, W., Li, X., Suk, J. W., Potts, J. R., & Ruoff, R. S. (2010) · Advanced Materials · doi:10.1002/adma.201001068 · Cited by 10,522
Self-citationDetection of individual gas molecules adsorbed on graphene
Schedin, F., Geim, A. K., Morozov, S. V., Hill, E. W., Blake, P., Katsnelson, M. I., & Novoselov, K. S. (2007) · Nature Materials · doi:10.1038/nmat1967 · Cited by 8,028
Monitoring dopants by Raman scattering in an electrochemically top-gated graphene transistor
Das, A., Pisana, S., Chakraborty, B., Piscanec, S., Saha, S. K., Waghmare, U. V., Novoselov, K. S., Krishnamurthy, H. R., Geim, A. K., Ferrari, A. C., et al. (2008) · Nature Nanotechnology · doi:10.1038/nnano.2008.67 · Cited by 3,621
Intrinsic and extrinsic performance limits of graphene devices on SiO2
Chen, J.-H., Jang, C., Xiao, S., Ishigami, M., & Fuhrer, M. S. (2008) · Nature Nanotechnology · doi:10.1038/nnano.2008.58 · Cited by 3,173
Transfer of Large-Area Graphene Films for High-Performance Transparent Conductive Electrodes
Li, X., Zhu, Y., Cai, W., Borysiak, M., Han, B., Chen, D., Piner, R. D., Colombo, L., & Ruoff, R. S. (2009) · Nano Letters · doi:10.1021/nl902623y · Cited by 3,081
Self-citationDoping Graphene with Metal Contacts
Giovannetti, G., Khomyakov, P. A., Brocks, G., Karpan, V. M., van den Brink, J., & Kelly, P. J. (2008) · Physical Review Letters · doi:10.1103/physrevlett.101.026803 · Cited by 2,605
Many-electron singularity in X-ray photoemission and X-ray line spectra from metals
Doniach, S., & Sunjic, M. (1970) · Journal of Physics C: Solid State Physics · doi:10.1088/0022-3719/3/2/010 · Cited by 2,577
Cited by
Two-dimensional flexible nanoelectronics
Akinwande, D., Petrone, N., & Hone, J. (2014) · Nature Communications · doi:10.1038/ncomms6678 · Cited by 1,910
Self-citationProgress and Challenges in Transfer of Large‐Area Graphene Films
Chen, Y., Gong, X., & Gai, J. (2016) · Advanced Science · doi:10.1002/advs.201500343 · Cited by 357
Gurunathan, S., & Kim, J.-H. (2016) · International Journal of Nanomedicine · doi:10.2147/ijn.s105264 · Cited by 316
Mohammed, H., Kumar, A., Bekyarova, E., Al-Hadeethi, Y., Zhang, X., Chen, M., Ansari, M. S., Cochis, A., & Rimondini, L. (2020) · Frontiers in Bioengineering and Biotechnology · doi:10.3389/fbioe.2020.00465 · Cited by 312
The role of contact resistance in graphene field-effect devices
Giubileo, F., & Di Bartolomeo, A. (2017) · Progress in Surface Science · doi:10.1016/j.progsurf.2017.05.002 · Cited by 257
Metadata
- Authors
- Suk, J. W., Lee, W. H., Lee, J., Chou, H., Piner, R. D., Hao, Y., Akinwande, D., & Ruoff, R. S.
- Venue
- Nano Letters
- Publisher
- American Chemical Society (ACS)
- Published
- 2013-03-19
- Volume
- 13
- Issue
- 4
- Pages
- 1462-1467
- ISSN
- 1530-6984 (ISSN-L)
- 1530-6992
- OpenAlex
- W1971608041
- Cited by
- 385
- References
- 42
- FWCI
- 17.76
- Type
- journal article
- Language
- en
- Open access
- closed
About these checks
Registry, retraction, Cites and statistics results are computed, not judged, with one exception: a printed reference that no index lists is read once by a model before it counts as a citation error. Claims are extracted by a model and kept only when their quote appears verbatim in the text; each cited source is then checked, with a model’s help, for whether it says what the claim relies on. Those verdicts can be wrong — read the claim’s quote and the cited source before relying on one.
Statistics and arithmetic are recomputed, not judged.
Confidence bands are shown only for fields calibrated on our annotated test set. None is calibrated yet, so no band is shown.
What counts as a claim ›How we measure confidence ›How we check this ›
Are you an author, or do you see a problem with this page? Request a review
Data sources
Bibliographic data: Semantic Scholar, OpenAlex, Crossref.
Contains information from the Semantic Scholar Academic Graph Datasets, made available under the ODC Attribution License (ODC-BY 1.0).
Semantic Scholar’s data is described in: Kinney, R., et al. (2023). The Semantic Scholar Open Data Platform. arXiv:2301.10140.
