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Investigation of Band-Offsets at Monolayer–Multilayer MoS2 Junctions by Scanning Photocurrent Microscopy

Open access
Howell, Sarah L., Jariwala, Deep, Wu, Chung-Chiang, Chen, Kan-Sheng, Sangwan, Vinod K., Kang, Junmo, Marks, Tobin J., Hersam, Mark C., Lauhon, Lincoln J.·2015·Nano Letters

Abstract

The thickness-dependent band structure of MoS2 implies that discontinuities in energy bands exist at the interface of monolayer (1L) and multilayer (ML) thin films. The characteristics of such heterojunctions are analyzed here using current versus voltage measurements, scanning photocurrent microscopy, and finite element simulations of charge carrier transport. Rectifying I-V curves are consistently observed between contacts on opposite sides of 1L/ML junctions, and a strong bias-dependent photocurrent is observed at the junction. Finite element device simulations with varying carrier concentrations and electron affinities show that a type II band alignment at single layer/multilayer junctions reproduces both the rectifying electrical characteristics and the photocurrent response under bias. However, the zero-bias junction photocurrent and its energy dependence are not explained by conventional photovoltaic and photothermoelectric mechanisms, indicating the contributions of hot carriers.

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Crossref · 10.1021/nl504311p

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Metadata

Authors
Howell, S. L., Jariwala, D., Wu, C.-C., Chen, K.-S., Sangwan, V. K., Kang, J., Marks, T. J., Hersam, M. C., & Lauhon, L. J.
Venue
Nano Letters
Published
2015-03-30
Volume
15
Issue
4
Pages
2278-2284
ISSN
  • 1530-6984 (ISSN-L)
  • 1530-6992
OpenAlex
W1994066597
Cited by
163
References
1
FWCI
9.46
Type
journal article
Language
en
Open access
green

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