The DOI matches its Crossref record; 4 of the 4 references it cites were found in a registry or an index.
Are There Fundamental Limitations on the Sheet Resistance and Transmittance of Thin Graphene Films?
Abstract
From published transmittance and sheet resistance data, we have calculated a figure of merit for transparent, conducting graphene films; the DC to optical conductivity ratio, sigma(DC)/sigma(Op). For most reported results, this conductivity ratio clusters around the values sigma(DC)/sigma(Op) = 0.7, 4.5, and 11. We show that these represent fundamental limiting values for networks of graphene flakes, undoped graphene stacks, and graphite films, respectively. The limiting value for graphene flake networks is much too low for transparent-electrode applications. For graphite, a conductivity ratio of 11 gives R(s) = 377Omega/ for T = 90%, far short of the 10 Omega/ minimum requirement for transparent conductors in current driven applications. However, we suggest that substrate-induced doping can potentially increase the 2-dimensional DC conductivity enough to make graphene a viable transparent conductor. We show that four randomly stacked graphene layers can display T approximately 90% and 10 Omega/ if the product of carrier density and mobility reaches nmu = 1.3 x 10(17) V(-1) s(-1). Given achieved doping values and attainable mobilities, this is just possible, resulting in potential values of sigma(DC)/sigma(Op) of up to 330. This is high enough for any transparent conductor application.
Overview
The claims and statistics of this paper haven’t been checked yet.
Run the check — free, no account needed. It reads the open-access text and checks the sources it cites.
Integrity signals
Registry
Cites
Statistics
Verification
Claims the paper makes
The claims and statistics of this paper haven’t been checked yet.
Run the check — free, no account needed. It reads the open-access text and checks the sources it cites.
Self-check
Percentages, sums and reported differences re-computed from the paper’s own numbers.
The self-check needs the paper’s full text.
Citations
Cites
Geim, A. K., & Novoselov, K. S. (2007) · Nature Materials · doi:10.1038/nmat1849 · Cited by 39,979
Two-dimensional gas of massless Dirac fermions in graphene
Novoselov, K. S., Geim, A. K., Morozov, S. V., Jiang, D., Katsnelson, M. I., Grigorieva, I. V., Dubonos, S. V., & Firsov, A. A. (2005) · Nature · doi:10.1038/nature04233 · Cited by 21,611
Graphene: Status and Prospects
Geim, A. K. (2009) · Science · doi:10.1126/science.1158877 · Cited by 13,942
Fine Structure Constant Defines Visual Transparency of Graphene
Nair, R. R., Blake, P., Grigorenko, A. N., Novoselov, K. S., Booth, T. J., Stauber, T., Peres, N. M. R., & Geim, A. K. (2008) · Science · doi:10.1126/science.1156965 · Cited by 9,084
Cited by
Graphene oxide as a chemically tunable platform for optical applications
Loh, K. P., Bao, Q., Eda, G., & Chhowalla, M. (2010) · Nature Chemistry · doi:10.1038/nchem.907 · Cited by 3,340
Large‐Scale Exfoliation of Inorganic Layered Compounds in Aqueous Surfactant Solutions
Smith, R. J., King, P. J., Lotya, M., Wirtz, C., Khan, U., De, S., O'Neill, A., Duesberg, G. S., Grunlan, J. C., Moriarty, G., et al. (2011) · Advanced Materials · doi:10.1002/adma.201102584 · Cited by 1,161
Self-citationEfficient Preparation of Large-Area Graphene Oxide Sheets for Transparent Conductive Films
Zhao, J., Pei, S., Ren, W., Gao, L., & Cheng, H.-M. (2010) · ACS Nano · doi:10.1021/nn1015506 · Cited by 938
Graphene as Transparent Electrode Material for Organic Electronics
Pang, S., Hernandez, Y., Feng, X., & Müllen, K. (2011) · Advanced Materials · doi:10.1002/adma.201100304 · Cited by 788
Size selection of dispersed, exfoliated graphene flakes by controlled centrifugation
Khan, U., O’Neill, A., Porwal, H., May, P., Nawaz, K., & Coleman, J. N. (2012) · Carbon · doi:10.1016/j.carbon.2011.09.001 · Cited by 309
Self-citation
Metadata
- Authors
- De, S., & Coleman, J. N.
- Venue
- ACS Nano
- Publisher
- American Chemical Society (ACS)
- Published
- 2010-04-12
- Volume
- 4
- Issue
- 5
- Pages
- 2713-2720
- ISSN
- 1936-0851 (ISSN-L)
- 1936-086X
- OpenAlex
- W2020823358
- Cited by
- 566
- References
- 4
- FWCI
- 19.92
- Type
- journal article
- Language
- en
- Open access
- closed
About these checks
Registry, retraction, Cites and statistics results are computed, not judged, with one exception: a printed reference that no index lists is read once by a model before it counts as a citation error. Claims are extracted by a model and kept only when their quote appears verbatim in the text; each cited source is then checked, with a model’s help, for whether it says what the claim relies on. Those verdicts can be wrong — read the claim’s quote and the cited source before relying on one.
Statistics and arithmetic are recomputed, not judged.
Confidence bands are shown only for fields calibrated on our annotated test set. None is calibrated yet, so no band is shown.
What counts as a claim ›How we measure confidence ›How we check this ›
Are you an author, or do you see a problem with this page? Request a review
Data sources
Bibliographic data: Semantic Scholar, OpenAlex, Crossref.
Contains information from the Semantic Scholar Academic Graph Datasets, made available under the ODC Attribution License (ODC-BY 1.0).
Semantic Scholar’s data is described in: Kinney, R., et al. (2023). The Semantic Scholar Open Data Platform. arXiv:2301.10140.