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Cited by 344

The DOI matches its Crossref record; 3 of the 3 references it cites were found in a registry or an index.

Improved Carrier Mobility in Few-Layer MoS2 Field-Effect Transistors with Ionic-Liquid Gating

Open access
Perera, Meeghage Madusanka, Lin, Ming-Wei, Chuang, Hsun-Jen, Chamlagain, Bhim Prasad, Wang, Chongyu, Tan, Xuebin, Cheng, Mark Ming-Cheng, Tománek, David, Zhou, Zhixian·2013·ACS Nano

Abstract

We report the fabrication of ionic liquid (IL)-gated field-effect transistors (FETs) consisting of bilayer and few-layer MoS2. Our transport measurements indicate that the electron mobility μ ≈ 60 cm(2) V(-1) s(-1) at 250 K in IL-gated devices exceeds significantly that of comparable back-gated devices. IL-FETs display a mobility increase from ≈ 100 cm(2) V(-1) s(-1) at 180 K to ≈ 220 cm(2) V(-1) s(-1) at 77 K in good agreement with the true channel mobility determined from four-terminal measurements, ambipolar behavior with a high ON/OFF ratio >10(7) (10(4)) for electrons (holes), and a near ideal subthreshold swing of ≈ 50 mV/dec at 250 K. We attribute the observed performance enhancement, specifically the increased carrier mobility that is limited by phonons, to the reduction of the Schottky barrier at the source and drain electrode by band bending caused by the ultrathin IL dielectric layer.

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Metadata

Authors
Perera, M. M., Lin, M.-W., Chuang, H.-J., Chamlagain, B. P., Wang, C., Tan, X., Cheng, M. M.-C., Tománek, D., & Zhou, Z.
Venue
ACS Nano
Published
2013-04-23
Volume
7
Issue
5
Pages
4449-4458
ISSN
  • 1936-0851 (ISSN-L)
  • 1936-086X
OpenAlex
W2164160345
Cited by
344
References
3
FWCI
14.21
Type
journal article
Language
en
Open access
green

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