The DOI matches its Crossref record; 4 of the 4 references it cites were found in a registry or an index.
Nanoelectronics from the bottom up
Overview
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Citations
Cites
Nanoionics-based resistive switching memories
Waser, R., & Aono, M. (2007) · Nature Materials · doi:10.1038/nmat2023 · Cited by 4,923
Nonvolatile Memory and Programmable Logic from Molecule-Gated Nanowires
Duan, X., Huang, Y., & Lieber, C. M. (2002) · Nano Letters · doi:10.1021/nl025532n · Cited by 346
Self-citationResistor-logic demultiplexers for nanoelectronics based on constant-weight codes
Kuekes, P. J., Robinett, W., Roth, R. M., Seroussi, G., Snider, G. S., & Williams, R. S. (2006) · Nanotechnology · doi:10.1088/0957-4484/17/4/035 · Cited by 40
Kuekes, P. J., Robinett, W., & Williams, R. S. (2005) · Nanotechnology · doi:10.1088/0957-4484/16/9/001 · Cited by 30
Cited by
Electronics and optoelectronics of two-dimensional transition metal dichalcogenides
Wang, Q. H., Kalantar-Zadeh, K., Kis, A., Coleman, J. N., & Strano, M. S. (2012) · Nature Nanotechnology · doi:10.1038/nnano.2012.193 · Cited by 16,374
Nanoionics-based resistive switching memories
Waser, R., & Aono, M. (2007) · Nature Materials · doi:10.1038/nmat2023 · Cited by 4,923
Nanoscale Memristor Device as Synapse in Neuromorphic Systems
Jo, S. H., Chang, T., Ebong, I., Bhadviya, B. B., Mazumder, P., & Lu, W. (2010) · Nano Letters · doi:10.1021/nl904092h · Cited by 4,174
Self-citationHammock, M. L., Chortos, A., Tee, B. C. ‐., Tok, J. B. ‐., & Bao, Z. (2013) · Advanced Materials · doi:10.1002/adma.201302240 · Cited by 2,396
Nanotechnology in the real world: Redeveloping the nanomaterial consumer products inventory
Vance, M. E., Kuiken, T., Vejerano, E. P., McGinnis, S. P., Hochella, M. F., Rejeski, D., & Hull, M. S. (2015) · Beilstein Journal of Nanotechnology · doi:10.3762/bjnano.6.181 · Cited by 1,785
Metadata
- Authors
- Lu, W., & Lieber, C. M.
- Venue
- Nature Materials
- Published
- 2007-11
- Volume
- 6
- Issue
- 11
- Pages
- 841-850
- ISSN
- 1476-1122 (ISSN-L)
- 1476-4660
- OpenAlex
- W2001992992
- Cited by
- 1,545
- References
- 4
- FWCI
- 103.32
- Type
- journal article
- Language
- en
- Open access
- closed
About these checks
Registry, retraction, Cites and statistics results are computed, not judged, with one exception: a printed reference that no index lists is read once by a model before it counts as a citation error. Claims are extracted by a model and kept only when their quote appears verbatim in the text; each cited source is then checked, with a model’s help, for whether it says what the claim relies on. Those verdicts can be wrong — read the claim’s quote and the cited source before relying on one.
Statistics and arithmetic are recomputed, not judged.
Confidence bands are shown only for fields calibrated on our annotated test set. None is calibrated yet, so no band is shown.
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How to cite
Cite CoChat for the checks on this page, and the paper for its own findings.
- This page
- CoChat. (2026). Citation check: Nanoelectronics from the bottom up. https://app.cochat.ai/papers/10.1038/nmat2028
- The paper
- Lu, W., & Lieber, C. M. (2007). Nanoelectronics from the bottom up. Nature Materials. https://doi.org/10.1038/nmat2028
Data sources
Bibliographic data: Semantic Scholar, OpenAlex, Crossref.
Contains information from the Semantic Scholar Academic Graph Datasets, made available under the ODC Attribution License (ODC-BY 1.0).
Semantic Scholar’s data is described in: Kinney, R., et al. (2023). The Semantic Scholar Open Data Platform. arXiv:2301.10140.
