Student or educator? Sign up with your school email and get 6 months of Pro free.
Cited by 94

The DOI matches its Crossref record.

Review of series and parallel connection of IGBTs

Shammas, N.Y.A., Withanage, R., Chamund, D.·2006·IEE Proceedings - Circuits, Devices and Systems

Abstract

The availability of high power handling devices is of a great importance in the present power electronics industry. These high power ratings can be achieve by connecting existing devices in series or parallel depending on the application. The main problems associated with series and parallel connections are unequal sharing of voltage and current respectively. The active gate control techniques, snubber circuits and clamping circuits are some of the most common methods used to minimise the problem of unequal sharing of voltage and current. The aim of the paper is to review the available techniques to minimise the problems in series and parallel connections of insulated gate bipolar transistors.

Overview

Integrity signals

Registry

Crossref · 10.1049/ip-cds:20050053

Cites

Statistics

Recomputing p-values needs the paper’s full text.

Verification

Claims the paper makes

This paper’s full text isn’t openly available, so its claims and self-check weren’t run. The registry and citation checks still apply.

Claims other papers make about this one

Each is checked against this paper’s own text: does it say what the citing paper says it does?

Citations

Cites

No references could be resolved yet.

Research works printed but not linked: 22

  1. Shakweh, 1999, Annual Power Electronics Specialist Conf., 2, 965, 10.1109/PESC.1999.785628 · DOI
  2. Chen, 1996, Proc. IEEE IECON 22nd Int. Conf., 2, 999
  3. Consoli, 1995, Conference Record of the Industry Applications Conf., 3, 2752
  4. Gerster, 1994, Conf. Proc. Applied Power Electronics Conf., 1, 469
  5. 10.1109/41.925575 · DOI
  6. 10.1109/63.602558 · DOI
  7. Palmer, 1996, Sixth Int. Conf. on Power Electronics and Variable Speed Drives, 236, 10.1049/cp:19960919 · DOI
  8. Hong, 1999, Proc. IEEE Int. Conf. on Power Electronics and Drive Systems, 2, 646, 10.1109/PEDS.1999.792747 · DOI
  9. 10.1109/28.968198 · DOI
  10. Katoh, 2002, IEEE 33rd Power Electronics Specialist Conf., 2, 609
  11. Bruckmann, 1998, Industry Applications Conf., 2, 1067
  12. Sasagawa, 2002, Conf. Record of the Industry Applications Conf., 4, 2597
  13. Saiz, Oct.2001, Conf. Record of the Industry Applications Conf. 2001, 2, 1046
  14. Piazzesi, 2004, IEEE 35th Annual Power Electronics Specialists Conf., 2004, 2, 893, 10.1109/PESC.2004.1355537 · DOI
  15. Busatto, 1998, Industry Applications Conf., 2, 825
  16. Nakatake, 2003, IEEE 34th Annual Power Electronics Specialist Conf., 4, 1910
  17. Chamund, 2002, Int. Universities Power Engineering Conf. (UPEC), 262
  18. 10.1109/28.126748 · DOI
  19. Hofer, 1996, Annual IEEE Power Electronics Specialist Conf., 2, 1312, 10.1109/PESC.1996.548751 · DOI · Paper page
  20. Benda, V., Gower, J., and Grant, D.A.: ‘Power semiconductor devices, theory and applications’, (John Wiley and Sons 1999)
  21. Belverde, 1998, IEEE Industry Applications Conf., 2, 817
  22. 10.1049/ip-cds:19982123 · DOI

Cited by

Metadata

Authors
Shammas, N. Y. A., Withanage, R., & Chamund, D.
Venue
IEE Proceedings - Circuits, Devices and Systems
Published
2006
Volume
153
Issue
1
Pages
34
ISSN
1350-2409
Cited by
94
References
0
Language
en

About these checks

Registry, retraction, Cites and statistics results are computed, not judged, with one exception: a printed reference that no index lists is read once by a model before it counts as a citation error. Claims are extracted by a model and kept only when their quote appears verbatim in the text; each cited source is then checked, with a model’s help, for whether it says what the claim relies on. Those verdicts can be wrong — read the claim’s quote and the cited source before relying on one.

Statistics and arithmetic are recomputed, not judged.

Confidence bands are shown only for fields calibrated on our annotated test set. None is calibrated yet, so no band is shown.

What counts as a claim ›How we measure confidence ›How we check this ›

Are you an author, or do you see a problem with this page? Request a review

How to cite

Cite CoChat for the checks on this page, and the paper for its own findings.

This page
CoChat. (2026). Citation check: Review of series and parallel connection of IGBTs. https://app.cochat.ai/papers/10.1049/ip-cds:20050053
The paper
Shammas, N. Y. A., Withanage, R., & Chamund, D. (2006). Review of series and parallel connection of IGBTs. IEE Proceedings - Circuits, Devices and Systems. https://doi.org/10.1049/ip-cds%3A20050053

Data sources

Bibliographic data: Semantic Scholar, OpenAlex, Crossref.

Contains information from the Semantic Scholar Academic Graph Datasets, made available under the ODC Attribution License (ODC-BY 1.0).

Semantic Scholar’s data is described in: Kinney, R., et al. (2023). The Semantic Scholar Open Data Platform. arXiv:2301.10140.