The DOI matches its Crossref record.
Scanning force microscopy - With Applications to Electric, Magnetic and Atomic Forces
Open accessAbstract
PART ONE: LEVERS AND NOISE 1. Mechanical properties of levers 2. Resonance enhancement 3. Sources of noise PART TWO: SCANNING FORCE MICROSCOPES 4. Tunneling detection systems 5. Capacitance detection systems 6. Homodyne detection systems 7. Heterodyne detection systems 8. Laser-Diode feedback detection systems 9. Polarization detection systems 10. Deflection detection systems PART THREE: SCANNING FORCE MICROSCOPY 11. Electric force microscopy 12. Magnetic force microscopy 13. Atomic force microscopy References Index
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Citations
Cited by
Cleveland, J. P., Manne, S., Bocek, D., & Hansma, P. K. (1993) · Review of Scientific Instruments · doi:10.1063/1.1144209 · Cited by 1,642
Weighing of biomolecules, single cells and single nanoparticles in fluid
Burg, T. P., Godin, M., Knudsen, S. M., Shen, W., Carlson, G., Foster, J. S., Babcock, K., & Manalis, S. R. (2007) · Nature · doi:10.1038/nature05741 · Cited by 1,213
Short cantilevers for atomic force microscopy
Walters, D. A., Cleveland, J. P., Thomson, N. H., Hansma, P. K., Wendman, M. A., Gurley, G., & Elings, V. (1996) · Review of Scientific Instruments · doi:10.1063/1.1147177 · Cited by 494
Spatially resolved force spectroscopy of biological surfaces using the atomic force microscope
Heinz, W. F., & Hoh, J. H. (1999) · Trends in Biotechnology · doi:10.1016/s0167-7799(99)01304-9 · Cited by 373
Metadata
- Authors
- Sarid, D., Coratger, R., Ajustron, F., & Beauvillain, J.
- Venue
- Microscopy Microanalysis Microstructures
- Publisher
- EDP Sciences
- Published
- 1991
- Volume
- 2
- Issue
- 6
- Pages
- 649-649
- ISSN
- 1154-2799 (ISSN-L)
- OpenAlex
- W2086697755
- Cited by
- 563
- References
- 0
- FWCI
- 7.54
- Type
- journal article
- Language
- en
- Open access
- bronze
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Registry, retraction, Cites and statistics results are computed, not judged, with one exception: a printed reference that no index lists is read once by a model before it counts as a citation error. Claims are extracted by a model and kept only when their quote appears verbatim in the text; each cited source is then checked, with a model’s help, for whether it says what the claim relies on. Those verdicts can be wrong — read the claim’s quote and the cited source before relying on one.
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How to cite
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- CoChat. (2026). Citation check: Scanning force microscopy - With Applications to Electric, Magnetic and Atomic Forces. https://app.cochat.ai/papers/10.1051/mmm:0199100206064900
- The paper
- Sarid, D., Coratger, R., Ajustron, F., & Beauvillain, J. (1991). Scanning force microscopy - With Applications to Electric, Magnetic and Atomic Forces. Microscopy Microanalysis Microstructures. https://doi.org/10.1051/mmm%3A0199100206064900
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Bibliographic data: Semantic Scholar, OpenAlex, Crossref.
Contains information from the Semantic Scholar Academic Graph Datasets, made available under the ODC Attribution License (ODC-BY 1.0).
Semantic Scholar’s data is described in: Kinney, R., et al. (2023). The Semantic Scholar Open Data Platform. arXiv:2301.10140.
